Hostname: page-component-848d4c4894-tn8tq Total loading time: 0 Render date: 2024-06-20T07:10:31.831Z Has data issue: false hasContentIssue false
  • English
  • Français

3D Microstructure Characterization and Analysis of Al-Si Foundry Alloys at Different Length Scales

Published online by Cambridge University Press:  27 August 2014

Michael Engstler ,
Jenifer Barrirero ,
Naureen Ghafoor ,
Magnus Odén  and
Frank Mücklich
Michael Engstler
Affiliation:
Material Engineering Center Saarland (MECS), Steinbeis Research Center, Saarbrücken, Germany Functional Materials, Department Material Science and Engineering, Saarland University, Saarbrücken, Germany
Jenifer Barrirero
Affiliation:
Functional Materials, Department Material Science and Engineering, Saarland University, Saarbrücken, Germany Division of Nanostructured Materials, Department of Physics, Chemistry and Biology, Linköping University, Sweden
Naureen Ghafoor
Affiliation:
Division of Nanostructured Materials, Department of Physics, Chemistry and Biology, Linköping University, Sweden
Magnus Odén
Affiliation:
Division of Nanostructured Materials, Department of Physics, Chemistry and Biology, Linköping University, Sweden
Frank Mücklich
Affiliation:
Material Engineering Center Saarland (MECS), Steinbeis Research Center, Saarbrücken, Germany Functional Materials, Department Material Science and Engineering, Saarland University, Saarbrücken, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 956 - 957
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Lasagni, F., et al., Adv. Eng. Mater. 10, (2008). p. 62.Google Scholar
[2] Lu, S., Hellawell, A. Metall. Trans. A 18 (1987) p. 1721.Google Scholar
[3] Barrirero, J., Engstler, M., Mücklich, F. Light Met (2013 (John Wiley & Sons, Inc., 2013).doi: 10.1002/9781118663189.Google Scholar
[4] Mücklich, F., Barrirero, J., Engstler, M. Proceedings of the 5th Conference on industrial Computed Tomography Wels (2014), accepted.Google Scholar
[5] The EU funding for the project AME-Lab (European Regional Development Fund C/4-EFRE-13/2009/Br) for the FIB/SEM is gratefully acknowledged. The atom probe was financed by the DFG and the federal state government of Saarland (INST 256/298-1 FUGG).Google Scholar