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3D Electron Ptychography

Published online by Cambridge University Press:  05 August 2019

Si Gao ,
Zhiyuan Ding ,
Xiaoqing Pan ,
Angus I. Kirkland  and
Peng Wang
Si Gao
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of China.
Zhiyuan Ding
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of China.
Xiaoqing Pan
Affiliation:
Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California, Irvine, CA, USA.
Angus I. Kirkland
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, UK. Electron Physical Sciences Imaging Centre, Diamond Lightsource Ltd., Diamond House, U.K.
Peng Wang
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of China.

Abstract

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Type
Theory and Applications of Electron Tomography in the Materials Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1802 - 1803
Copyright
Copyright © Microscopy Society of America 2019 

References

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[3]Wang, P et al. Scientific Reports 7 (2017), p. 2857.Google Scholar
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[5]Song, B et al. , Physical Review Letters 121 (2018), p. 146101.Google Scholar
[6]Song, J et al. , Scientific Reports, Accepted.Google Scholar
[7]Gao, S et al. , Nature Communications 8 (2017), p. 163.Google Scholar
[8]Maiden, AM, Humphry, MJ and Rodenburg, JM, Journal of the Optical Society of America a 29 (2012), p. 1606.Google Scholar
[9]The authors acknowledge funding from the National Natural Science Foundation of China (11874199, 11474147), and the National Basic Research Program of China, (2015CB654901).Google Scholar