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20-kV Diffractive Imaging of Graphene by using an SEM-based Dedicated Microscope

Published online by Cambridge University Press:  23 September 2015

Osamu Kamimura ,
Takashi Dobashi ,
Yosuke Maehara ,
Ryo Kitaura ,
Hisanori Shinohara  and
Kazutoshi Gohara
Osamu Kamimura
Affiliation:
Central Research Laboratory, Hitachi, Ltd., Kokubunji-shi, Tokyo, Japan
Takashi Dobashi
Affiliation:
Central Research Laboratory, Hitachi, Ltd., Kokubunji-shi, Tokyo, Japan
Yosuke Maehara
Affiliation:
Division of Applied Physics, Faculty of Engineering, Hokkaido University, Sapporo, Japan
Ryo Kitaura
Affiliation:
Department of Chemistry & Institute for Advanced Research, Nagoya University, Nagoya, Japan
Hisanori Shinohara
Affiliation:
Department of Chemistry & Institute for Advanced Research, Nagoya University, Nagoya, Japan
Kazutoshi Gohara
Affiliation:
Division of Applied Physics, Faculty of Engineering, Hokkaido University, Sapporo, Japan

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 35 - 36
Copyright
Copyright © Microscopy Society of America 2015 

References

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[4] Kamimura, O, et al, Ultramicroscopy 110 (2010). p. 130.CrossRefGoogle Scholar
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[6] Part of this work was supported by the Japan Science and Technology Agency.Google Scholar