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Rapid characterization of inclusionary cleanliness in steels by PDA-OES mapping

Published online by Cambridge University Press:  25 October 2002

R. Meilland  and
L. Dosdat
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Abstract

The recent developments of the Pulse Discrimination Analysis by Optical Emission Spectrometry (PDA-OES) and the application of this technique for static analysis as well as for chemical mapping permit to characterize inclusions or heterogeneities with a size ranging from 2 to 20-30 μm. The present improvements of OES permit the steelmakers to have a more detailed information than by the conventional chemical analysis methods. The fast identification of defects such as inclusions or segregation permits to validate more easily the product quality and to adapt the processes.

Type
Research Article
Information
Metallurgical Research & Technology , Volume 99 , Issue 4: AciériesCoulées continuesRéfractaires , April 2002 , pp. 373 - 382
Copyright
© La Revue de Métallurgie, 2002

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