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Microtomography data processing methods for cryogenic target characterization

Published online by Cambridge University Press:  01 October 1999

I.V. ALEKSANDROVA
Affiliation:
Lebedev Physical Institute, Russian Academy of Sciences, P.O. Box 117924, Leninskiy 53, Moscow
E.R. KORESHEVA
Affiliation:
Lebedev Physical Institute, Russian Academy of Sciences, P.O. Box 117924, Leninskiy 53, Moscow
I.E. OSIPOV
Affiliation:
Lebedev Physical Institute, Russian Academy of Sciences, P.O. Box 117924, Leninskiy 53, Moscow
V.I. GOLOV
Affiliation:
Computing Center of Russian Academy of Sciences, P.O. Box 117967, Vavilova 40, Moscow
V.I. CHTCHERBAKOV
Affiliation:
Moscow State University, Department of Low Temperatures Physics, P.O. Box 119899, Vorobjovy Gory 4, Moscow

Abstract

Determining the cryogenic target parameters with high precision calls for the development of a new direction in the area of target characterization based on microtomography methods of data processing. In this report we present our first results in this area.

Type
Research Article
Copyright
1999 Cambridge University Press

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