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Diagnosis of the soft X-ray spectrum emitted by laser-plasmas using a spectroscopic photon sieve

Published online by Cambridge University Press:  14 June 2012

Yulin Gao
Affiliation:
National Key Laboratory of Laser Fusion; Research Center of Laser Fusion, Mianyang, Sichuan, China
Weimin Zhou
Affiliation:
National Key Laboratory of Laser Fusion; Research Center of Laser Fusion, Mianyang, Sichuan, China
Lai Wei
Affiliation:
National Key Laboratory of Laser Fusion; Research Center of Laser Fusion, Mianyang, Sichuan, China
Leifeng Cao
Affiliation:
National Key Laboratory of Laser Fusion; Research Center of Laser Fusion, Mianyang, Sichuan, China
Xiaoli Zhu
Affiliation:
Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China
Zongqing Zhao
Affiliation:
National Key Laboratory of Laser Fusion; Research Center of Laser Fusion, Mianyang, Sichuan, China
Yuqiu Gu
Affiliation:
National Key Laboratory of Laser Fusion; Research Center of Laser Fusion, Mianyang, Sichuan, China
Baohan Zhang
Affiliation:
National Key Laboratory of Laser Fusion; Research Center of Laser Fusion, Mianyang, Sichuan, China
Changqing Xie
Affiliation:
Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China
Corresponding
E-mail address:

Abstract

Laser plasma experiments, which demonstrated the single order diffraction property of spectroscopic photon sieve (a novel single-order diffraction grating), were performed on the SILEX-I femto-second laser facility. High-intensity laser radiation was focused onto a Cu target to generate plasma. The spectra of soft X-ray from copper plasmas have been measured with spectroscopic photon sieve based spectrograph. The results show that the spectroscopic photon sieve is able to provide soft X-ray spectrum free from higher-order diffraction components. The measured spectra obtained with such a spectroscopic photon sieve need no unfolding process to extract higher-order diffraction interference.

Type
Research Article
Copyright
Copyright © Cambridge University Press 2012

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