Hostname: page-component-76fb5796d-x4r87 Total loading time: 0 Render date: 2024-04-26T14:46:08.928Z Has data issue: false hasContentIssue false

Vapor-deposited CaWO4 phosphor

Published online by Cambridge University Press:  31 January 2011

P. F. Carcia
Affiliation:
DuPont Central Research and Development, Experimental Station, P.O. Box 80356, Wilmington, Delaware 19880-0356
M. Reilly
Affiliation:
DuPont Central Research and Development, Experimental Station, P.O. Box 80356, Wilmington, Delaware 19880-0356
C. C. Torardi
Affiliation:
DuPont Central Research and Development, Experimental Station, P.O. Box 80356, Wilmington, Delaware 19880-0356
M. K. Crawford
Affiliation:
DuPont Central Research and Development, Experimental Station, P.O. Box 80356, Wilmington, Delaware 19880-0356
C. R. Miao
Affiliation:
DuPont Central Research and Development, Experimental Station, P.O. Box 80356, Wilmington, Delaware 19880-0356
B. D. Jones
Affiliation:
DuPont Central Research and Development, Experimental Station, P.O. Box 80356, Wilmington, Delaware 19880-0356
Get access

Abstract

In this paper we describe the preparation, microstructure, and x-ray excited luminescence of vapor-deposited CaWO4 films up to about 50 μm thick, comparing them to particulate CaWO4 phosphor screens, used in medical diagnostic imaging. Films that we e-beam evaporated on substrates heated at or above 500 °C were polycrystalline with the scheelite structure, while on unheated substrates, films were initially amorphous but became crystalline after annealing them in air above about 750 °C. Crystalline CaWO4 films irradiated with x-rays produced light emission peaked at 430 nm. The emission intensity depended on film thickness and grain size and was comparable to particulate CaWO4 phosphor screens. Because the vapor-deposited films also exhibited superior resolution, they are promising for diagnostic x-ray imaging.

Type
Articles
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.van der Eijk, B. and Kuhl, W., Philips Tech. Rev. 41, 136 (1983/1984).Google Scholar
2.Jing, T., Cho, G., Drewery, J., Fujieda, I., Kaplan, S. N., Mireshghi, A., Perez-Mendez, V., and Wildermuth, D., IEEE Trans. Nucl. Sci. 39, 1195 (1992).CrossRefGoogle Scholar
3.Maruska, H. P., Parados, T., Kalkhoran, N. M., and Halverson, W. D., in Flat Panel Display Materials, edited by Batey, J., Chiang, A., and Holloway, P. H. (Mater. Res. Soc. Symp. Proc. 345, Pittsburgh, PA, 1994), p. 269.Google Scholar
4.Greer, J. A., Van Hook, H. J., Tabat, M. D., Nguyen, H. Q., Gammie, G., and Koufopoulos, P. F., in Flat Panel Display Materials, edited by Batey, J., Chiang, A., and Holloway, P. H. (Mater. Res. Soc. Symp. Proc. 345, Pittsburgh, PA, 1994), p. 281.Google Scholar
5.Leverenz, H. W., Introduction to Luminescence of Solids (Dover, New York, 1968).Google Scholar
6.Movchan, B. A. and Demchishin, A. V., Phys. Metall. Metallogr. 28, 83 (1969).Google Scholar
7.Thornton, J. A., Ann. Rev. Mater. Sci. 7, 239 (1977).CrossRefGoogle Scholar
8.Brixner, L. H., Mater. Chem. Phys. 16, 253 (1987).CrossRefGoogle Scholar
9.Curry, T. S. III, Dowdey, J. E., and Murry, R. C., Jr., Christensen's Physics of Diagnostic Radiology (Lea and Febiger, Philadelphia, PA, 1990), Chap. 9, p. 118ff.Google Scholar
10.Barrett, H. H. and Swindell, W., Radiological Imaging (Academic Press, New York, 1981), Vol. I, Chap. 5, p. 192ff.Google Scholar
11.Blasse, G. and Grabmaier, B. C., Luminescent Materials (Springer-Verlag, Berlin, 1994), Chap. 8, p. 146ff.CrossRefGoogle Scholar
12.Feldman, C., J. Soc. Motion Pic. Eng. 67, 455 (1958).Google Scholar
13.Cho, W-S., Yashima, M., Kudo, A., Kakihana, M., Kudo, A., Sakata, T., and Yoshimura, M., Appl. Phys. Lett. 66, 1027 (1995).CrossRefGoogle Scholar
14.Blasse, G., Structure and Bonding 42, 1 (1980).CrossRefGoogle Scholar
15.Busselt, W. and Raue, R., J. Electrochem. Soc. 135, 764 (1988).CrossRefGoogle Scholar
16.Raue, R., Vink, A. T., and Welker, T., Philips Tech. Rev. 44, 335 (1989).Google Scholar
17.Fonger, W. H., Appl. Opt. 21, 1219 (1982); W. H. Fonger, Appl. Opt. 21, 1222 (1982).CrossRefGoogle Scholar