Hostname: page-component-8448b6f56d-tj2md Total loading time: 0 Render date: 2024-04-24T15:16:07.268Z Has data issue: false hasContentIssue false
  • English
  • Français

Texture analysis and microstructural features in YBa2Cu3O6+x zone-partial-melted samples with Y2BaCuO5 additions

Published online by Cambridge University Press:  31 January 2011

R. Cabré ,
E. Martínez ,
Jna. Gavaldá ,
R. Solé ,
J. Massons ,
C. Rillo ,
M. Aguiló  and
F. Díaz
R. Cabré
Affiliation:
Departament d'Enginyeria Electrònica, Elèctrica i Automàtica, Universitat Rovira i Virgili, Tarragona, Catalunya, Spain
E. Martínez
Affiliation:
Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Zaragoza, Spain
Jna. Gavaldá
Affiliation:
Laboratori de Física Aplicada i Cristal.lografia, Universitat Rovira i Virgili, Tarragona, Catalunya, Spain
R. Solé
Affiliation:
Laboratori de Física Aplicada i Cristal.lografia, Universitat Rovira i Virgili, Tarragona, Catalunya, Spain
J. Massons
Affiliation:
Laboratori de Física Aplicada i Cristal.lografia, Universitat Rovira i Virgili, Tarragona, Catalunya, Spain
C. Rillo
Affiliation:
Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Zaragoza, Spain
M. Aguiló
Affiliation:
Laboratori de Física Aplicada i Cristal.lografia, Universitat Rovira i Virgili, Tarragona, Catalunya, Spain
F. Díaz
Affiliation:
Laboratori de Física Aplicada i Cristal.lografia, Universitat Rovira i Virgili, Tarragona, Catalunya, Spain
Get access

Abstract

Rod-shaped samples of YBa2Cu3O6+x (Y123) with different contents of Y2BaCuO5 (Y211) are textured by the partial-zone melting method in order to produce single-domain specimens. The microstructure and magnetic properties of the samples are analyzed as a function of the Y211 initial addition. Y211 precipitates are more homogeneously distributed and smaller, and the superconducting properties of the sample also improve, so when the initial content of Y211 increases, Jc values are high. Texture analysis is carried out by the x-ray pole figure technique.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 5 , May 1999 , pp. 1711 - 1719
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Salama, K., Selvamanickam, V., Gao, L., and Sun, K., J. Appl. Phys. Lett. 54, 2352 (1991).Google Scholar
2.Jin, S., Tiefel, T. H., Sherwood, R. C., van Dover, R. B., Davis, M. E., Kammlot, G. W., and Fastnacht, R. A., Phys. Rev. B 37, 7850 (1988).CrossRefGoogle Scholar
3.Yamamoto, T., Stubicar, M., Chan, S.K., Lu, J. G., Prasanna, T. R. S., and O'Handley, R. C., Mater. Sci. Eng. A133, 127 (1991).Google Scholar
4.Ekin, J. W., Salama, K., and Selvamanickam, V., Nature 350, 26 (1991).CrossRefGoogle Scholar
5.McGinn, P.J., Chen, W., Zhu, N., Lanagan, M., and Balachandran, U., Appl. Phys. Lett. 57, 1455 (1990).CrossRefGoogle Scholar
6.McGinn, P. J., Chen, W., Zhu, N., Balachandran, U., and Lanagan, M. T., Physica C 165, 480 (1990).CrossRefGoogle Scholar
7.McGinn, P.J., Zhu, N., Chen, W., Lanagan, M., and Balachandran, U., Physica C 167, 343 (1990).Google Scholar
8.Murakami, M., Fujimoto, H., Gotoh, S., Yamaguchi, K., Koshizuka, N., and Tanaka, S., Physica C 185–189, 321 (1991).CrossRefGoogle Scholar
9.Salama, K., Selvamanickam, V., and Lee, D. F., Processing and Properties of High-Tc Superconductors, edited by Jin, S. (World Scientific Publishing Co., Singapore, 1993), Vol. 1, Chap. 5.Google Scholar
10.Cabré, R., Gavaldà, Jna., Solé, R., Ruiz, X., Aguiló, M., Díaz, F., and Martínez, E., Physica C 260, 57 (1996).CrossRefGoogle Scholar
11.Cabré, R., Gavaldà, Jna., Solé, R., Ruiz, X., Massons, J., Aguiló, M., and Díaz, F., Physica C 290, 297 (1997).CrossRefGoogle Scholar
12.Cabré, R., Gavaldà, Jna., Massons, J., Solé, R., Ruiz, X., Aguiló, M., and Díaz, F., Supercond. Sci. Technol. 11, 30 (1998).CrossRefGoogle Scholar
13.Varanasi, C. and McGinn, P. J., J. Electron. Mater. 22, 1252 (1993).CrossRefGoogle Scholar
14.Griffith, M.L., Huffman, R.T., and Halloran, J. W., J. Mater. Res. 9, 1633 (1994).CrossRefGoogle Scholar
15.Izumi, T. and Shiohara, Y., J. Mater. Res. 7, 16 (1992).CrossRefGoogle Scholar
16.Cima, M.J., Flemings, M. C., Figueredo, A. M., Nakade, M., Ishii, H., Brody, H. D., and Haggerty, J., J. Appl. Phys. 72, 185 (1992).CrossRefGoogle Scholar
17.Sandiumenge, F., Vilalta, N., Piñol, S., Martinez, B., and Obradors, X., Phys. Rev. B. 52, 6645 (1995).CrossRefGoogle Scholar
18.Gyorgy, E.M., van Dover, R. B., Jackson, K., Schneeneyer, L. F., and Waszczak, J. V., Appl. Phys. Lett. 55, 283 (1989).CrossRefGoogle Scholar
19.Nakamura, Y., Furuya, K., Izumi, T., and Shiohara, Y., J. Mater. Res. 9, 1350 (1994).CrossRefGoogle Scholar
20.Imagawa, Y. and Shiohara, Y., Physica C, 262 243 (1996).CrossRefGoogle Scholar
21.Müller, D. and Freyhardt, H. C., Physica C 242, 283 (1995).CrossRefGoogle Scholar
22.McGinn, P.J., Zhu, N., Chen, W., Sengupta, S., and Li, T., Physica C 176, 203 (1991).CrossRefGoogle Scholar
23.Gopalan, R., Roy, T., Rajasekharan, T., Rangarajan, G., and Hari Babu, N., Physica C 244, 106 (1995).CrossRefGoogle Scholar
24.Taylor, K. N. R., Nouruzi-Khorasani, A., Indro, M., Russell, G. J., Darby, M.I., Feng, Y., Jones, I. P., and Smallman, R. E., J. Cryst. Growth 119, 221 (1992).CrossRefGoogle Scholar
25.Dorosinskii, L., Farber, B., Indenbom, M., Nikitenko, V., Polyanskii, A., and Vlasko-Vlasov, V., Ferroelectrics 3, 321 (1990).CrossRefGoogle Scholar
26.Kim, C-J., Lee, H-G., Kim, K-B., and Hong, G-W., J. Mater. Res. 10, 2235 (1995).CrossRefGoogle Scholar
27.Diko, P., Wende, C., Litzkendorf, D., Klupsch, T., and Gawalek, W., Proceedings of the SMART 97, Liege, June 1997.Google Scholar
28.Kim, C-J., Kim, K-B., Chang, I-S., and Won, D-Y., J. Mater. Res. 8, 699 (1993).Google Scholar
29.Mironova, M., Lee, D. F., and Salama, K., Physica C 211, 188 (1993).Google Scholar
30.Murakami, M., Supercond. Sci. Technol. 5, 185 (1992).CrossRefGoogle Scholar
31.Lee, D. F., Selvamanickam, V., and Salama, K., Physica C 202, 83 (1992).CrossRefGoogle Scholar
32.Wang, Z.L., Goyal, A., and Kroeger, D.M., Phys. Rev. B 47, 5373 (1993).CrossRefGoogle Scholar
33.Adamopoulos, N., Soylu, B., Yan, Y., and Evetts, J. E., Physica C 242, 68 (1995).Google Scholar