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Preparation and comparison of YBa2Cu4O8 films on MgO(100) and SrTiO3(100) by MOCVD

Published online by Cambridge University Press:  03 March 2011

H. Sakai ,
Y. Shiohara  and
S. Tanaka
H. Sakai
Affiliation:
Superconductivity Research Laboratory, International Superconductivity Technology Center, 10-13 Shinonome 1-chome, Kotoku, Tokyo 135, Japan
Y. Shiohara
Affiliation:
Superconductivity Research Laboratory, International Superconductivity Technology Center, 10-13 Shinonome 1-chome, Kotoku, Tokyo 135, Japan
S. Tanaka
Affiliation:
Superconductivity Research Laboratory, International Superconductivity Technology Center, 10-13 Shinonome 1-chome, Kotoku, Tokyo 135, Japan
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Abstract

The thin films (Y/Ba/Cu = 1.0/2.7/4.7) which have a strong intensity corresponding to the c-axis peaks of the 124 phase (YBa2Cu4O8) in x-ray diffraction (XRD) patterns were prepared. The film structure and surface morphology of these films were observed by scanning electron microscopy (SEM), energy dispersive x-ray (EDX), transmission electron microscopy (TEM), and atomic force microscopy (AFM). It was found that the film on MgO(100) clearly has grain boundaries with many a-axis oriented grains of the 123 phase (YBa2Cu3O7−x). However, the film on SrTiO3(100) had a smooth surface, and a-axis oriented grains of the 123 phase couldn't be observed. This difference could not be explained by only the difference in the lattice mismatch.

Type
Articles
Information
Journal of Materials Research , Volume 8 , Issue 9 , September 1993 , pp. 2143 - 2148
Copyright
Copyright © Materials Research Society 1993

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References

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