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Plan-view microstructures of Co/Ru bilayers

Published online by Cambridge University Press:  03 March 2011

G.Z. Pan ,
A. Michel ,
V. Pierron-Bohnes ,
P. Vennéguès  and
M.C. Cadeville
G.Z. Pan*
Affiliation:
Group d'Etude des Matériaux Métalliques, Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 0046 CNRS-Université Louis Pasteur, 23 rue du Loess, 67037 Strasbourg Cedex, France
A. Michel
Affiliation:
Group d'Etude des Matériaux Métalliques, Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 0046 CNRS-Université Louis Pasteur, 23 rue du Loess, 67037 Strasbourg Cedex, France
V. Pierron-Bohnes
Affiliation:
Group d'Etude des Matériaux Métalliques, Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 0046 CNRS-Université Louis Pasteur, 23 rue du Loess, 67037 Strasbourg Cedex, France
P. Vennéguès
Affiliation:
Group d'Etude des Matériaux Métalliques, Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 0046 CNRS-Université Louis Pasteur, 23 rue du Loess, 67037 Strasbourg Cedex, France
M.C. Cadeville
Affiliation:
Group d'Etude des Matériaux Métalliques, Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 0046 CNRS-Université Louis Pasteur, 23 rue du Loess, 67037 Strasbourg Cedex, France
*
a)On leave from the Laboratory of Electron Microscope, Institute of Physics, Chinese Academy of Sciences.
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Abstract

Plan-view microstructures of two Co/Ru bilayers with a composition of [Co12ÅRu45Å]2 and [Co40ÅRu35Å]2 have been studied by conventional and high resolution electron microscopy. Large differences in electron diffraction and image contrast between the two bilayers were observed, which are recognized as the microstructural variations during the relaxation of large coherent planar strains when the Co layers wet coherently or semicoherently the Ru layers. For the [Co12ÅRu45Å]2 bilayer, the Co layers are unrelaxed from the Ru layers; only one set of electron diffraction patterns was observed, and the image consists of three types of contrasts which are closely related with either the generation and movement of misfit dislocations or large coherent strains. For the [Co40ÅRu35Å]2 bilayer, the Co layers are relaxed basically from the Ru layers; two sets of electron diffraction patterns with double diffraction spots were observed, and the image consists of small irregular areas with moiré fringe dots.

Type
Articles
Information
Journal of Materials Research , Volume 10 , Issue 6 , June 1995 , pp. 1539 - 1545
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1Falicov, L. M., Pierce, D. T., Bader, S. D., Gronsky, R., Hathaway, K. B., Hopster, H. J., Lambeth, D. N., Parkin, S. S. P., Prinz, G., Salamon, M., Schuller, I. K., and Victora, R. H., J. Mater. Res. 5, 1299 (1990).CrossRefGoogle Scholar
2Parkin, S. S. P., More, N., and Roche, K. P., Phys. Rev. Lett. 64, 2304 (1990).CrossRefGoogle Scholar
3Muller, L. D., Ounadjela, K., Vennéguès, P., Pierron-Bohnes, V., Arbaoui, A., Jay, J. P., Dinia, A., and Panissod, P., J. Magn. Magn. Mater. 104–107, 1873 (1992).Google Scholar
4Cadeville, M. C., in Alloy Modeling and Design, edited by Stocks, G. M. and Turchi, P. E. A. (The Minerals, Metals and Materials Society, Warrendale, PA, 1994), p. 309.Google Scholar
5Zhang, B., Krishman, K. M., and Farrow, R. F. C., Ultramicroscopy 51, 298 (1993).CrossRefGoogle Scholar
6Hakkens, F., De Veirman, A., Coene, W., and de Breeder, F. J. A., J. Mater. Res. 8, 1019 (1993).CrossRefGoogle Scholar
7Vennéguès, P., Pierron-Bohnes, V., Michel, A., Muller, D., Ehret, G., Esnouf, C., Electron Microscopy VII, EUREM 92, Granada, Spain (1992), p. 753; Michel, A.et al., unpublished.Google Scholar
8Petford-Long, A. K., Donovan, P. E., and Heys, A., Ultramicroscopy 47, 323 (1992).CrossRefGoogle Scholar
9Bertero, G. A., Hufnagel, T. C., Clemens, B. M., and Sinclair, R., J. Mater. Res. 8, 771 (1993).CrossRefGoogle Scholar
10Li, Z. G. and Carcia, P. F., Ultramicroscopy 47, 313 (1992).CrossRefGoogle Scholar
11Davis, B. M., Li, D. X., Seidman, D. N., Ketterson, J. B., Bhadra, R., and Grimsditch, M., J. Mater. Res. 7, 1356 (1992).CrossRefGoogle Scholar
12Chien, C. J., Farrow, R. F. C., Lee, C. H., Lin, C. J., and Marinero, E. E., J. Magn. Magn. Mater. 93, 47 (1991).CrossRefGoogle Scholar
13We call the Burgers vector one of the 1/3〈112¯0〉 lattice vectors because we could not recognize it as one of the 1/3〈112¯0〉 lattice vectors of Co or Ru, due to the fact that the image results from the total interaction between the incident electron beam and both the Co and Ru layers.Google Scholar
14Pashley, D. W., Stowell, M. J., Jacobs, M. H., and Law, T. J., Philos. Mag. 10, 127 (1964).CrossRefGoogle Scholar
15Matthews, J. W., Epitaxial Growth, in Materials Science and Technology Series, Part B, edited by Matthews, J. W. (Academic Press, New York, 1975), p. 584.Google Scholar