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Multilayered Structures of SrNb0.1Ti0.9O3/La0.8Sr0.2MnO3/SrTiO3 Prepared by Laser Molecular Beam Epitaxy

Published online by Cambridge University Press:  31 January 2011

X. L. Ma*
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, P. R. China
H. B. Lu
Affiliation:
Laboratory of Optical Physics, Institute of Physics, Chinese Academy of Sciences, 100080 Beijing, China
F. Chen
Affiliation:
Laboratory of Optical Physics, Institute of Physics, Chinese Academy of Sciences, 100080 Beijing, China
Z. H. Chen
Affiliation:
Laboratory of Optical Physics, Institute of Physics, Chinese Academy of Sciences, 100080 Beijing, China
G. Z. Yang
Affiliation:
Laboratory of Optical Physics, Institute of Physics, Chinese Academy of Sciences, 100080 Beijing, China
*
a)Address all correspondence to this author. e-mail: xlma@imr.ac.cn
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Abstract

Multilayer oxides of SrNb0.1Ti0.9O3/La0.8Sr0.2MnO3/SrTiO3 have been grown by computer-controlled laser molecular beam epitaxy and characterized by transmission electron microscopy. Electron microdiffractions and high-resolution imaging reveal that the as-prepared thin film of La0.8Sr0.2MnO3 with thickness of 200 nm is epitaxially grown on the SrTiO3(001) substrate and the SrNb0.1Ti0.9O3 with thickness of 250 nm epitaxially on the as-received La0.8Sr0.2MnO3 film. The microstructures in the La0.8Sr0.2MnO3 film are clarified in terms of the oriented microdomains. In contrast, microstructures in SNTO are featured by the formation of superstructures due to charge ordering. Crystallographic relationships of these domains are discussed on the basis of an orthorhombic cell and rationalized by theoretical calculations based on a geometrical model.

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Articles
Copyright
Copyright © Materials Research Society 2002

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References

Tabata, H., Tanaka, H., and Kawai, T., Appl. Phys. Lett. 65, 1970 (1994).CrossRefGoogle Scholar
Tabata, H. and Kawai, T., Appl. Phys. Lett. 70, 321 (1997).CrossRefGoogle Scholar
Zhao, T., Chen, Z.H., Chen, F., Shi, W.S., Lu, H.B., and Yang, G.Z., Phys. Rev. B 60, 1697 (1999).CrossRefGoogle Scholar
Kusters, R.M., Singleton, J., Keon, D.A., Greedy, R.M., and Hayes, W., Physica B 155, 362 (1989).CrossRefGoogle Scholar
R. Von Helmolt, Wecker, J., Holzapfel, B., Schultz, L., and Samwer, K., Phys. Rev. Lett. 71, 2331 (1993).Google Scholar
Chabara, K., Ohno, T., Kasai, M., and Kozono, Y., Appl. Phys. Lett. 63, 1190 (1993).Google Scholar
Jin, S., Tiefel, T.H., McCormack, M., Fastnacht, P.A., Ramesh, R., and Chen, L.H., Science 264, 413 (1994).CrossRefGoogle Scholar
Fröhlich, K., Vávra, I., Gömöry, F., Šonc, J., Bydžovský, J., Kováv, P., Dobrovodský, J., and Maryško, M., J. Magn. Magn. Mater. 211, 67 (2000).CrossRefGoogle Scholar
Arita, M., Sasaki, A., Hamada, K., Okada, A., Hayakawa, J., Asano, H., Matsui, M., and Takahashi, H., J. Magn. Magn. Mater. 211, 84 (2000).CrossRefGoogle Scholar
Hervieu, M., Tendeloo, G. Van, Caignaert, V., Maigana, A., and Raveau, B., Phys. Rev. B 53, 14274 (1996).CrossRefGoogle Scholar
Lobanov, M.V., Balagurov, A.M., V. Ju. Pomjakushin, Fischer, P., Gutmann, M., Abakumov, A.M., D’yachenko, O.G., Antipov, E.V., Lebedev, O.I., and Tendeloo, G. Van, Phys. Rev. B 61, 8941 (2000).CrossRefGoogle Scholar
Tendeloo, G. Van, Lebedev, O.I., and Amelinckx, S., J. Magn. Magn. Mater. 211, 73 (2000).CrossRefGoogle Scholar
Lu, C.J., Wang, Z.L., Xiong, G.C., and Lian, G.J., J. Mater. Res. 15, 2454 (2000).CrossRefGoogle Scholar
Jiang, J.C., Tian, W., Pan, X.Q., Gan, Q., and Eom, C.B., Appl. Phys. Lett. 72, 2963 (1998).CrossRefGoogle Scholar
Ikuhara, Y. and Pirouz, P., Mater. Sci. Forum 207–209, 121 (1996).CrossRefGoogle Scholar
Stemmer, S., Pirouz, P., Ikuhara, Y., and Davis, R.F., Phys. Rev. Lett. 77, 1797 (1996).CrossRefGoogle Scholar
Ma, X.L., Shibata, N., and Ikuhara, Y., J. Mater. Res. 14, 15971603 (1999).CrossRefGoogle Scholar
Déchamps, M., Guevara, A.M. de Leon, Pinsard, L., and Revcolevschi, A., Philos. Mag. A 80, 119 (2000).CrossRefGoogle Scholar
Lebedev, O.I., Tendeloo, G. Van, Amelinckx, S., Leibold, B., and Habermeier, H-U., Phys. Rev. B 58, 8065 (1998).CrossRefGoogle Scholar
Zandbergen, H.W., Jansen, J., Freisem, S., Nojima, T., and Aarts, J., Philos. Mag. A 80, 337 (2000).CrossRefGoogle Scholar
Lebedev, O.I., G. Van Tendeloo, Abakumov, A.M., Amelinckx, S., Leibold, B., and Habermeier, H-U., Philos. Mag. A 79, 1461 (1999).CrossRefGoogle Scholar