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Microstructure of La1–xCaxMnO3 studied by transmission electron microscopy

Published online by Cambridge University Press:  31 January 2011

Q. Chen*
Affiliation:
Department of Electronics, Peking University, Beijing 100871, People's Republic of China
J. Tao
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, 1304 W. Green Street, Urbana, Illinois 61801
J. J. Zuo
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, 1304 W. Green Street, Urbana, Illinois 61801
J. J. H. Spence
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, Arizona 85287
*
a)Address all correspondence to this author.qchen@ele.pku.edu.cn
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Abstract

Microstructures of La1-xCaxMnO3 compounds (x = ⅓ and 0.5) prepared with and without intermediate grinding were studied using transmission electron microscopy. A high density of antiphase boundaries (APBs) with displacement vector 1/2 〈111〉, indexed in orthorhombic unit cell, has been observed in bulk samples with no or minimum intermediate grinding. The nature of this APB is analyzed and found to bedue to the symmetry breaking introduced by the tilting of MnO6 octahedra relative to the ideal perovskite structure. Samples prepared using two intermediate grinds do not show these defects indicating that the microstructure can be controlled through synthesis routes. The effect of domain boundaries on the colossal magnetoresistance effect is discussed.

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Articles
Copyright
Copyright © Materials Research Society 2001

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