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Measuring critical stress for shear failure of interfacial regions in coating/interlayer/substrate systems through a micro-pillar testing protocol

Published online by Cambridge University Press:  12 January 2017

Yang Mu
Affiliation:
Mechanical & Industrial Engineering Department, Louisiana State University, Baton Rouge, LA 70803, USA
Xiaoman Zhang
Affiliation:
Mechanical & Industrial Engineering Department, Louisiana State University, Baton Rouge, LA 70803, USA
John W. Hutchinson
Affiliation:
School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138, USA
Wen Jin Meng*
Affiliation:
Mechanical & Industrial Engineering Department, Louisiana State University, Baton Rouge, LA 70803, USA
*
a) Address all correspondence to this author. e-mail: wmeng1@lsu.edu
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Abstract

Mechanical integrity of the interfacial region between ceramic coatings and substrates is critical to high performance coated mechanical components and manufacturing tools. Mechanical failure of the coating/substrate interfacial region often leads to catastrophic failure of the coated system as a whole. Despite extensive research over the past two decades, quantitative assessment of the mechanical response of coating/substrate interfacial regions remains a challenge. The lack of reliable protocols for measuring the mechanical response of coating/substrate interfacial regions quantitatively hampers the understanding of key factors controlling the mechanical integrity of coating/substrate interfaces. In this paper, we describe a new micro-pillar testing protocol for quantitative measurement of critical stresses for inducing shear failure of interfacial regions in ceramic-coating/metal-adhesion-layer/substrate systems. We observe significant differences in the critical stress for shear failure of interfacial regions in CrN/Cu/Si, CrN/Cr/Si, and CrN/Ti/Si systems. The present testing protocol has general applicability to a wide range of coating/interlayer/substrate systems.

Type
Articles
Copyright
Copyright © Materials Research Society 2017 

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Footnotes

Contributing Editor: George M. Pharr

References

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