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Infrared reflectivity and intrinsic dielectric behavior of RETiTaO6 (RE = Y, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, and Yb) microwave ceramics

Published online by Cambridge University Press:  03 March 2011

C.W.A. Paschoal ,
R.L. Moreira ,
K.P. Surendran  and
M.T. Sebastian
C.W.A. Paschoal
Affiliation:
Departamento de Física–Centro de Ciências Exatas e da Terra-Universidade Federal do Maranhão, Campus do Bacanga, São Luís (Maranhão), 65085-580 Brazil
R.L. Moreira*
Affiliation:
Departamento de Física–Instituto de Ciências Exatas-Universidade Federal de Minas Gerais, Belo Horizonte (Minas Gerais), 30161-970 Brazil
K.P. Surendran
Affiliation:
Ceramics Technology Division, Regional Research Laboratory, Trivandrum, 695 019 India
M.T. Sebastian
Affiliation:
Ceramics Technology Division, Regional Research Laboratory, Trivandrum, 695 019 India
*
a)Address all correspondence to this author. e-mail: bmoreira@fisica.ufmg.br
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Abstract

In this work, we performed infrared reflectivity measurements of RETiTaO6 dielectric ceramics for rare-earth (RE) = Y, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, and Yb. The infrared spectra were analyzed through the four-parameter semi-quantum model based on two orthorhombic (aeschynite and euxenite) structures presented by the ceramics. We discerned the strongest phonon modes that contribute to the intrinsic dielectric behavior of the two families. Then the unloaded quality factors and the dielectric permittivities were estimated at the microwave region. The variations of the intrinsic dielectric response of both systems with RE ion substitution are discussed in terms of changes in their dielectric polarizabilities. It is proposed that the covalency of the RE–O bonds play an important role in the evolution of dielectric permittivity as well as in the sign of the temperature coefficient of the resonant frequency.

Keywords

CeramicsDielectric propertiesInfrared spectroscopy
Type
Articles
Information
Journal of Materials Research , Volume 20 , Issue 5 , May 2005 , pp. 1164 - 1171
Copyright
Copyright © Materials Research Society 2005

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