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Electrical characterization of BaTiO3 heteroepitaxial thin films by hydrothermal synthesis

Published online by Cambridge University Press:  31 January 2011

A. T. Chien ,
X. Xu ,
J. H. Kim ,
J. Sachleben ,
J. S. Speck  and
F. F. Lange
A. T. Chien
Affiliation:
Materials Department and Materials Research Laboratory, University of California, Santa Barbara, CA 93106
X. Xu
Affiliation:
Materials Department and Materials Research Laboratory, University of California, Santa Barbara, CA 93106
J. H. Kim
Affiliation:
Materials Department and Materials Research Laboratory, University of California, Santa Barbara, CA 93106
J. Sachleben
Affiliation:
Materials Department and Materials Research Laboratory, University of California, Santa Barbara, CA 93106
J. S. Speck
Affiliation:
Materials Department and Materials Research Laboratory, University of California, Santa Barbara, CA 93106
F. F. Lange
Affiliation:
Materials Department and Materials Research Laboratory, University of California, Santa Barbara, CA 93106
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Abstract

The electrical properties of hydrothermally grown epitaxial pseudocubic BaTiO3 thin films formed on epitaxial electrode layers of SrRuO3 on SrTiO3 single crystal substrates have been evaluated by variable frequency dielectric testing. The initial as-synthesized BaTiO3 film displayed a dielectric constant of 450 with very high losses (tan δ ˜ ~ 100%) at 10 kHz due to OH− and H2O, incorporated during growth, contributing to migration losses within the film. Improvements were seen with increasing postprocessing heat-treatment time and temperature with improved properties seen after a heat treatment at 300 °C for 24 h (ε ˜ ~ 200, tan δ ˜ ~ 8%). Relationships were established for dielectric constant and loss tangent with structural changes observed by Fourier transform infrared spectroscopy, thermal gravimetric analysis, nuclear magnetic resonance spectroscopy, and x-ray diffraction.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 8 , August 1999 , pp. 3330 - 3339
Copyright
Copyright © Materials Research Society 1999

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