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Effects of Nd2O3 on the microwave dielectric properties of BiNbO4 ceramics

Published online by Cambridge University Press:  31 January 2011

Whan Choi
Affiliation:
Ceramics Processing Center, Korea Institute of Science and Technology, Seoul, Korea
Kyung-Yong Kim
Affiliation:
Ceramics Processing Center, Korea Institute of Science and Technology, Seoul, Korea
Myung-Rip Moon
Affiliation:
Department of Electronic Materials Engineering, The University of Suwon, Suwon, Kyunggi-do 445-743, Korea
Kyoo-Sik Bae
Affiliation:
Department of Electronic Materials Engineering, The University of Suwon, Suwon, Kyunggi-do 445-743, Korea
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Abstract

Effects of Nd substitution with Bi on the microwave dielectric properties of BiNbO4 were studied. Bi1−xNdxNbO4 ceramics sintered at 920–980 °C consisted of orthorhombic and triclinic phases. The amount of triclinic phase increased with the increase in the Nd content, x, and sintering temperature. The apparent density and the dielectric constant decreased with the Nd content, but increased with sintering temperature, reached the peak values at 960 °C and then rapidly decreased. The Q × f0 value was between 11,000 and 13,000 GHz over all sintering temperatures for x < 0.05, but for x ≥ 0.05 it reached the peak value at 950 °C and then rapidly decreased. The temperature coefficient of resonance frequency increased in the positive direction with the Nd content and showed the minimum value of −1.82 ppm/°C for x = 0.025 sintered at 940 °C. However, it rapidly increased in the negative direction for sintering temperature over 960 °C.

Type
Articles
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

1.Kagata, H., Inoue, T., Kato, J., Kameyama, I., and Ishizaki, T., Ceramics Trans. 32, 81 (1993).Google Scholar
2.Ling, H. C., Yan, M. F., and Rhodes, W. W., J. Mater. Res. 5, 1752 (1990).Google Scholar
3.Takenaka, T., Maruyama, K., and Sakata, K., Jpn. J. Appl. Phys. 30, Suppl. 30–9B 2236 (1991).Google Scholar
4.Kagata, H., Inoue, T., Kato, J., and Kameyama, I., Jpn. J. Appl. Phys. 31, 3152 (1992).Google Scholar
5.Hakki, B. W. and Coleman, P. D., IRE Trans. Microwave Theory & Tech. 8, 402 (1960).Google Scholar
6.Roth, R. S. and Waring, J. L., J. Res. Natl. Bur. Stand. Sec. A 66A, 451 (1962).CrossRefGoogle Scholar
7.Brook, R. J., Proc. Br. Ceram. Soc. 32, 7 (1982).Google Scholar
8.Moulson, A. J. and Herbert, J. M., Electroceramics (Chapman & Hall, London, England, 1990), p. 237.Google Scholar