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Characterizing mechanical behavior of atomically thin films: A review

Published online by Cambridge University Press:  02 January 2014

Changhong Cao ,
Yu Sun  and
Tobin Filleter
Changhong Cao
Affiliation:
Department of Mechanical and Industrial Engineering, University of Toronto, Ontario M5S 3G8, Canada
Yu Sun*
Affiliation:
Department of Mechanical and Industrial Engineering, University of Toronto, Ontario M5S 3G8, Canada
Tobin Filleter*
Affiliation:
Department of Mechanical and Industrial Engineering, University of Toronto, Ontario M5S 3G8, Canada
*
a)Address all correspondence to these authors. e-mail: sun@mie.utoronto.ca
b)e-mail: filleter@mie.utoronto.ca
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Abstract

Atomically thin films, such as graphene, graphene oxide, hexagonal-boron nitride (h-BN), and molybdenum disulfide (MoS2), have attracted intensive studies to explore their properties and potential applications as next generation materials due to their outstanding mechanical, electrical, thermal, and optical properties. The study of the mechanical behavior of this class of materials is in particular interesting as it not only physically determines the potential application fields where these materials can be utilized but also has revealed unique mechanical size effects and phenomena. Researchers have been studying the mechanical properties such as elastic modulus, strength, friction, and fracture behavior of atomically thin films for over a decade now. Here, we review recent results of the mechanical characterization and understanding of this class of materials.

Type
Invited Reviews
Information
Journal of Materials Research , Volume 29 , Issue 3: Focus Issue: Graphene and Beyond , 14 February 2014 , pp. 338 - 347
Copyright
Copyright © Materials Research Society 2014 

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References

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