Hostname: page-component-76fb5796d-qxdb6 Total loading time: 0 Render date: 2024-04-26T02:50:56.459Z Has data issue: false hasContentIssue false

Characterization of pulsed laser deposited PbO/MoS2 by transmission electron microscopy

Published online by Cambridge University Press:  03 March 2011

S.D. Walck
Affiliation:
WL/MLBT, Materials Directorate, Wright-Patterson Air Force Base, Ohio 45433-7750
M.S. Donley
Affiliation:
WL/MLBT, Materials Directorate, Wright-Patterson Air Force Base, Ohio 45433-7750
J.S. Zabinski
Affiliation:
WL/MLBT, Materials Directorate, Wright-Patterson Air Force Base, Ohio 45433-7750
V.J. Dyhouse
Affiliation:
Research Institute, University of Dayton, Dayton, Ohio 45469-0168
Get access

Abstract

Films of PbO/MoS2, grown by pulsed laser deposition, exhibit a significant improvement in tribological performance compared to MoS2 films grown by the same process. The microstructure and crystallography of PbO/MoS2 composite films were investigated using transmission electron microscopy (TEM) to identify the features responsible for this tribological improvement. Self-supporting samples were prepared from pulsed laser deposited, PbO/MoS2 thin films grown on single crystal sodium chloride substrates. Films deposited at room temperature exhibited a two-phase microstructure with one of the phases being amorphous. X-ray microanalysis results showed that the crystalline phase had significantly higher concentration ratios of Mo/Pb, Mo/S, and Pb/S than did the amorphous phase. Films grown at 300 °C were polycrystalline, with a grain size of about 20 nm, and had a NaCl type structure which was isomorphous to PbS. The grains had rectangular shape, and exhibited preferred orientation with the sodium chloride substrate. The concentration of S for these films was approximately 80% of the S concentration for films grown at room temperature. Both the high temperature and room temperature films had S concentrations which were higher than expected from the MoS2 in the target; this was attributed to gettering of the S in the vacuum chamber by Pb. The electron diffraction results, together with previously published results, suggest that the crystal structure of the phases in these films is not responsible for the improvement in tribological properties. However, the microstructural components formed during film growth do determine the wear-induced chemical reaction pathways.

Type
Articles
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Clauss, F. J., Solid Lubricants and Self-Lubricating Solids (Academic Press, New York, 1972).Google Scholar
2Haltner, A. J. and Oliver, C. S., Nature 308 (1960).CrossRefGoogle Scholar
3Murphy, G. P., U.S. Patent 3 223 626 (1965) and U.S. Patent 3 314 885 (1967).Google Scholar
4Calhoun, S. F., Meade, F. S., Murphy, G. P., and Young, R. L., J. ASLE, March, 97 (1965).Google Scholar
5Bartz, W. J., Holinski, R., and Xu, J., ASLE Proc. 3rd Int. Conf. on Solid Lubr., ASLE SP–14, 88 (1984).Google Scholar
6Stupp, B. C., Thin Solid Films 84, 257 (1981).CrossRefGoogle Scholar
7Lavik, M. T., Hubble, R. D., and McConnell, B. D., Lubr. Eng. 31, 20 (1975).Google Scholar
8Nosov, M. I., Khimiia i Tekhnologiia i Masel (Chemistry and Technology of Fuel Oils) 7, 43 (1978).Google Scholar
9Yamamoto, E., Wada, K., Fukuzuka, T., Shimogori, K., Fujiwara, K., and Tsuji, K., Lubr. Eng. 40, 588 (1984).Google Scholar
10Harmer, R. S. and Pantano, C. G., Technical Rep. AFML-TR-77–227 (1978).Google Scholar
11Centers, P. W., Tribology Trans. 31 (2), 149 (1987).CrossRefGoogle Scholar
12Centers, P. W., Wear 122, 97 (1988).CrossRefGoogle Scholar
13Klenke, C. J., Tribology Int. 23 (2), 23 (1990).CrossRefGoogle Scholar
14Gardos, M. N., Tribology Trans. 31 (2), 214 (1987).CrossRefGoogle Scholar
15Donley, M. S., Murray, P. T., Barber, S. A., and Haas, T. W., Surf. Coat. Technol. 36, 329 (1988).CrossRefGoogle Scholar
16Zabinski, J. S., Donley, M. S., John, P. J., Dyhouse, V. J., Safriet, A., and McDevitt, N. T., in Surface Chemistry and Beam-Solid Interactions, edited by Atwater, H. A., Houle, F. A., and Lowndes, D. H. (Mater. Res. Soc. Symp. Proc. 201, Pittsburgh, PA, 1991), p. 195.Google Scholar
17Donley, M. S., Zabinski, J. S., Dyhouse, V. J., John, P. J., Murray, P. T., and McDevitt, N. T., Lecture Notes on Physics, edited by Miller, J. C. and Haglund, R. F. Jr. (Springer-Verlag, New York, 1991), Vol. 389, pp. 271279.Google Scholar
18Zabinski, J. S., Donley, M. S., Dyhouse, V. J., and McDevitt, N. T., Thin Solid Films 214, 156 (1992).CrossRefGoogle Scholar
19McDevitt, N. T., Donley, M. S., and Zabinski, J. S., Wear 166 (1993).Google Scholar
20Cliff, G. and Lorimer, G. W., J. Microsc. 103, 203 (1975).CrossRefGoogle Scholar
21Zaluzec, N. J., EMSA Bull. 14 (1), edited by Anderson, R., 67 (1984).Google Scholar
22JCPDS-International Center for Diffraction Data, Swarthmore, PA, Sets 1–41, PbMoO4, Card No. 8–475.Google Scholar
23JCPDS-International Center for Diffraction Data, Swarthmore, PA, Sets 1–41, PbS, Card No. 5–592.Google Scholar
24Walck, S. D., Donley, M. S., Zabinski, J. S., and Dyhouse, V. J., J. Mater. Res. 8, 2933 (1993).CrossRefGoogle Scholar