Hostname: page-component-76fb5796d-r6qrq Total loading time: 0 Render date: 2024-04-27T02:40:02.760Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic structure of YB56 studied by digital high-resolution electron microscopy and electron diffraction

Published online by Cambridge University Press:  31 January 2011

Takeo Oku ,
Jan-Olov Bovin ,
Iwami Higashi ,
Takaho Tanaka  and
Yoshio Ishizawa
Takeo Oku*
Affiliation:
Institute of Scientific and Industrial Research, Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan
Jan-Olov Bovin
Affiliation:
National Center for HREM, Inorganic Chemistry 2, Chemical Center, Lund University, P.O. Box 124, S-221 00 Lund, Sweden
Iwami Higashi
Affiliation:
Department of Chemistry, Chiba Institute of Technology, Narashino, Chiba 275-0016, Japan
Takaho Tanaka
Affiliation:
National Institute for Research in Inorganic Materials, Tsukuba, Ibaraki 305-0044, Japan
Yoshio Ishizawa
Affiliation:
Iwaki Meisei University, Iwaki, Fukushima 970–8551, Japan
*
a)Address all correspondence to this author. e-mail: yunkui li@hotmail.com
Get access

Abstract

Atomic positions for Y atoms were determined by using high-resolution electron microscopy and electron diffraction. A slow-scan charge-coupled device camera which had high linearity and electron sensitivity was used to record high-resolution images and electron diffraction patterns digitally. Crystallographic image processing was applied for image analysis, which provided more accurate, averaged Y atom positions. In addition, atomic disordering positions in YB56 were detected from the differential images between observed and simulated images based on x-ray data, which were B24 clusters around the Y-holes. The present work indicates that the structure analysis combined with digital high-resolution electron microscopy, electron diffraction, and differential images is useful for the evaluation of atomic positions and disordering in the boron-based crystals.

Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 1 , January 2001 , pp. 101 - 107
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Seybolt, A.U., Trans. Am. Soc. Met. 52, 971 (1960).Google Scholar
2.Richards, S.M. and Kasper, J.S., Acta Crystallogr. 25, 237 (1969).CrossRefGoogle Scholar
3.Slack, G.A., Oliver, D.W., Brower, G.D., and Young, J.D., J. Phys. Chem. Solids 38, 45 (1977).Google Scholar
4.Kamimura, K., Tanaka, T., Otani, S., Ishizawa, Y., Rek, Z.U., and Wong, J., J. Cryst. Growth 238, 429 (1993).CrossRefGoogle Scholar
5.Tanaka, T., Ishizawa, Y., Wong, J., Rek, Z.U., Rowen, M., Schäfers, F., and Muller, B.R., Jpn. J. Appl. Phys. Ser. 10, 110 (1994).Google Scholar
6.Higashi, I., Kobayashi, K., Tanaka, T., and Ishizawa, Y., J. Solid State Chem. 133, 16 (1997).Google Scholar
7.Perkins, C.L., Trenary, M., and Tanaka, T., J. Solid State Chem. 133, 31 (1997).CrossRefGoogle Scholar
8.Kuhlmann, U., Werheit, H., Tanaka, T., and Ishizawa, Y., Proc. Int. Symp. Boron, Borides, Relat. Compd. 12, 69 (1996).Google Scholar
9.Oku, T., Carlsson, A., Wallenberg, L.R., Malm, J-O., Bovin, J-O., Higashi, I., Tanaka, T., and Ishizawa, Y., J. Solid State Chem. 135, 182 (1998).Google Scholar
10.Oku, T. and Nakajima, S., J. Mater. Res. 13, 1136 (1998).Google Scholar
11.Oku, T. and Higashi, I., Solid State Commun. 115, 547 (2000).CrossRefGoogle Scholar
12.Oku, T. and Nakajima, S., Appl. Phys. Lett. 75, 2226 (1999).Google Scholar
13.Oku, T. and Bovin, J-O., Philos. Mag. A 79, 821 (1999).CrossRefGoogle Scholar
14.Cowley, J.M. and Moodie, A.F., Acta Crystallogr. 10, 609 (1957).Google Scholar
15.Hovmöller, S., Sjögren, A., Farrants, G., Sundberg, M., and Marinder, B-O., Nature 331, 238 (1984).CrossRefGoogle Scholar
16.Weirich, T.E., Ramlau, R., Simon, A., Hovmöller, S., and Zou, X.D., Nature 382, 144 (1996).Google Scholar
17.Smith, A.R. and Eyring, L., Ultramicroscopy 8, 65 (1982).CrossRefGoogle Scholar