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Surface chemical states of barium titanate: Influence of sample processing

Published online by Cambridge University Press:  03 March 2011

Sharmila M. Mukhopadhyay
Affiliation:
Polytechnic University, 6 Metrotech Center, Brooklyn, New York 11201
Tim C.S. Chen
Affiliation:
Polytechnic University, 6 Metrotech Center, Brooklyn, New York 11201
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Abstract

The composition and chemistry of the near-surface region of BaTiO3 have been studied using x-ray photoelectron spectroscopy (XPS). It is found that the Ba3d photoclectron peak shows two chemical states, one of which is attributed to the bulk perovskite and the other to a special surface state unrelated to contamination. The bulk component is reduced and the surface component increases when the material is annealed at high temperatures (either in reducing or oxidizing atmosphere). Both the components are unaltered if the sample is exposed to air, solvents, or water: processes that lead to adsorption of impurities. The surface peak, therefore, attributed to a relaxation related and not contamination-related state, has been compared with those in other Ba-containing oxides. The oxygen photoelectron peak consists of a normal perovskite peak typical of most titanates and a higher energy component clearly related to surface contamination. Annealing in reducing atmosphere results in drastically different optical and electrical properties, and in chemical reduction of some Ti4+ ions to Ti3+. The overall stoichiometry, however, does not change with annealing atmosphere. These results have been discussed in light of our current understanding of this and other related oxides.

Type
Articles
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1Moulson, A. J. and Herbert, J. M., Electroceramics-Materials, Properties and Applications (Chapman and Hall Publishers, London, 1992).Google Scholar
2Pohanka, R. C. and Smith, P. S., in Electronic Ceramics, edited by Levinson, L.M. (Marcel Dekker Inc., New York, 1988).Google Scholar
3Warren, W. L. and Dimis, D., Appl. Phys. Lett., Feb. 64(7), 866 (1994).Google Scholar
4Klein, M. B., in Photorefractive Materials and Their Applications I; Vol. 61 of Topics in Applied Physics, edited by Gunter, P. and Huignard, J.P. (Springer-Verlag, Berlin, 1988), p. 195.Google Scholar
5Desu, S. B. and Payne, D., J. Am. Ceram. Soc. 73(11), 3391 (1990).CrossRefGoogle Scholar
6Chiang, Y-M. and Takagi, T., J. Am. Ceram. Soc. 73(11), 3278 (1990).CrossRefGoogle Scholar
7Lewis, G. V. and Catlow, C.R.A., Radiat. Eff. 73, 307 (1983); J. Phys. Chem. Solids 47(1), 89 (1986).Google Scholar
8Henrich, V. E., Rep. Prog. Phys. 48, 1481 (1985).Google Scholar
9Hudson, L.T., Kurtz, R. L., Robey, S. W., Temple, D., and Stockbauer, R.L., Phys. Rev. B 47(3), 1174 (1993).CrossRefGoogle Scholar
10Meyer, H. M. III, Hill, D. M., Wagener, T. J., Gao, Y., Weaver, J. H., Capone, D.W. II, and Goretta, K. C., Phys. Rev. B 38, 10 (1988).Google Scholar
11Fukuda, Y., Nagoshi, M., Suzuki, T., Namba, Y., Syono, Y., and Tachiki, M., Phys. Rev. B 39(16), 11494 (1989).Google Scholar
12Flavell, W. R., Rebuts, A. J., Morris, B. C., Hoad, D. R. C., Tweddell, I., Kelbsa, A., Lindsay, R., Thornton, G., Wincott, P. L., and Turner, T. S., Supercon. Sci. Technol. 9, 648 (1992).Google Scholar
13Chang, C. C., Hegde, M. S., Wu, X. D., Dutta, B., Inam, A., Venkatesan, T., Wilkens, B. J., and Wachtman, J. B. Jr., J. Appl. Phys. 67, 12, June 15 (1990).Google Scholar
14Mukhopadhyay, S. M., Chen, T. C. S., and Wei, C., Appl. Supercond. (1995, in press).Google Scholar
15Mukhopadhyay, S. M. and Chen, C. S., J. Appl. Phys., July 15 (1993).Google Scholar