Hostname: page-component-77c89778f8-7drxs Total loading time: 0 Render date: 2024-07-21T09:09:13.163Z Has data issue: false hasContentIssue false
  • English
  • Français

Subsolidus phase equilibria in the PbO-poor part of the TiO2–PbO–SiO2 system and its application in low-temperature thick-film dielectrics

Published online by Cambridge University Press:  03 March 2011

Marko Hrovat ,
Thomas Maeder ,
Caroline Jacq ,
Janez Holc  and
Janez Bernard
Marko Hrovat*
Affiliation:
Jožef Stefan Institute, Jamova 39, SI-1000 Ljubljana, Slovenia
Thomas Maeder
Affiliation:
Ecole Polytechnique Federale de Lausanne, CH-1015 Lausanne, Switzerland
Caroline Jacq
Affiliation:
Ecole Polytechnique Federale de Lausanne, CH-1015 Lausanne, Switzerland
Janez Holc
Affiliation:
Jožef Stefan Institute, Jamova 39, SI-1000 Ljubljana, Slovenia
Janez Bernard
Affiliation:
Slovenian National Building and Civil Engineering Institute, Dimičeva 12, SI-1000 Ljubljana, Slovenia
*
a) Address all correspondence to this author. e-mail: marko.hrovat@ijs.si
Get access

Abstract

Subsolidus equilibria in the PbO-poor part of the TiO2–PbO–SiO2 diagram were studied with the aim of investigating possible applications for low-temperature thick-film dielectrics. The tie lines are between PbTiO2 and PbSiO3, and between PbTiO3 and SiO2. The results show that the TiO2, when added to low-temperature softening point glasses, reacts with the PbO from the glass, so forming PbTiO3. These results were applied to a low-temperature firing dielectric, consisting of a lead-rich PbO–SiO2–B2O3 glass filled with a TiO2 powder. The conversion of TiO2 to the PbTiO3 crystalline phase was observed above firing temperatures of approximately 600 °C. The kinetics of the reaction depend on the particle size of the TiO2.

Keywords

DielectricPhase equilibriaX-ray diffraction (XRD)
Type
Articles
Information
Journal of Materials Research , Volume 21 , Issue 12 , December 2006 , pp. 3210 - 3214
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Ellis, M.E., Richter, F., Levitsky, M.E.Thick film on stainless steel: Applications, methods and processes. Proceedings of the 2000 International Symposium on Microelectronics IMAPS-2000,Boston, MA,September 20–22, 2000, pp. 330–334.Google Scholar
2.Jacq, C., Maeder, T., Ryser, P.: High-strain response of piezoresistive thick-film resistors on titanium alloy substrates. J. Eur. Ceram. Soc. 24(6), 1897 (2004).CrossRefGoogle Scholar
3.Hrovat, M., Belavič, D., Benčan, A., Holc, J., Dražič, G.: A characterisation of thick-film PTC resistors. Sens. Actuators, A 117(2), 256 (2005).CrossRefGoogle Scholar
4.Eisa, M.A., Abadir, M.F., Gadala, A.M.: The system TiO2-PbO in air. Trans. J. Br. Ceram. Soc. 79(4), 100 (1980).Google Scholar
5.Roth, R.S., Negas, T., Cook, L.P.System PbO-SiO2: Phase diagrams for ceramists. Am. Ceram. Soc. IV(Suppl), Fig. 5172 (1981). [After R.M. Smart and F.P. Glasser: Compound formation and phase equilibria in the system lead oxide–silicon dioxide. J. Am. Ceram. Soc. 57(9), 378 (1974)].Google Scholar
6.SiO2–TiO2 System Phase Diagrams for Ceramists, edited by Levin, E.M., Robbins, C.R., McMurdie, H.F., The American Ceramic Society, 1964, Vol. 1, Fig. 113. [After R.C. DeVries, R. Roy, and E.F. Osborn: The system titania–silica. Trans. J. Br. Ceram. Soc. 53(9), 525 1954 ].Google Scholar
7.Jacq, C., Maeder, T., Vionnet, S., Ryser, P.: Low-temperature thick-film dielectrics and resistors for metal substrates. J. Eur. Ceram. Soc. 25(12), 2121 (2005).CrossRefGoogle Scholar
8.Johnson, D.W., Hummel, F.A.: Phase equilibria and liquid immiscibility in the system PbO–B2O3–SiO2. J. Am. Ceram. Soc. 51(4), 196 (1968).CrossRefGoogle Scholar
9.Prudenziati, M., Morten, B., Forti, B., Gualtier, A.F., Dilliway, G.M.: Devitrification kinetics of high lead glass for hybrid microelectronics. Int. J. Inorg. Mater. 3, 667 (2001).CrossRefGoogle Scholar
10.Xing, X., Deng, J., Che, J., Liu, G.: Novel thermal expansion of lead titanate. Rare Metals 22(4), 1 (2003).Google Scholar
11.Trubnikov, I.L.: Thermal expansion and corrosion behavior of lead-borosilicate glasses. Refractories Indust. Ceram. 41(5–6), 169 (2000).CrossRefGoogle Scholar
12. European Parliament and of the Council: On the Restriction of the Use of Certain Hazardous Substances in Electrical and Electronic Equipment (ROHS). Directive 2002/95/EC, 2002.Google Scholar