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Electrolyte electroreflectance study of TiO2 films modified with metal nanoparticles

Published online by Cambridge University Press:  31 January 2011

A. I. Kulak ,
A. I. Kokorin  and
D. V. Sviridov
A. I. Kulak*
Affiliation:
Institute of General and Inorganic Chemistry, Belarusian Academy of Sciences, Surganov St. 9, Minsk 220072, Belarus
A. I. Kokorin
Affiliation:
Institute of Chemical Physics, Russian Academy of Sciences, Kosygin St. 4, 117977 Moscow B-334, Russia
D. V. Sviridov
Affiliation:
Institute for Physico-Chemical Problems, Belarusian State University, Leningradskaya St. 14, 220050 Minsk, Belarus
*
a)Address all correspondence to this author.
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Abstract

Electrolyte electroreflectance (EER) has been used as an in situ probe for determining the distribution of energy states at the surface of naked and metal-modified TiO2 film in contact with aqueous solution. The surface modification of polycrystalline TiO2films by electrodeposition of fine (a few nanometers in size) metal particles has been shown to result in the appearance of surface states with an energy of approximately 2.15 eV for Cu, 2.40 eV for Pd, 2.50 and 2.30 eV (two peaks in the EER spectrum) for Pt, and 2.65 eV for Ag (the energy values are measured versus valence band edge of TiO2). The important role of metal-induced surface states in the enhancement of charge exchange between conduction band of semiconductor oxide and metal islets has been demonstrated using the electrocatalytic oxidation of boron hydride as a model reaction.

Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 8 , August 2001 , pp. 2357 - 2361
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1Aspens, D.A., Surf. Sci. 37, 418 (1973).CrossRefGoogle Scholar
2Boschloo, G.K., Goossens, A., and Schoonman, J., J. Electroanal. Chem. 428, 25 (1997).CrossRefGoogle Scholar
3Scholtz, G.A. and Gerischer, H.J. Electrochem. Soc. 132, 1643 (1985).CrossRefGoogle Scholar
4Pujados, M. and Salvador, P., J. Electrochem. Soc. 136, 716 (1989).CrossRefGoogle Scholar
5Chaparro, A.M., Alonso-Vante, N., Salvador, P., and Tributsch, H., J Electrochem. Soc. 144, 2991 (1997).CrossRefGoogle Scholar
6Makuta, I.D., Poznyak, S.K., and Kulak, A.I., Solid State Commun. 76, 65 (1990).CrossRefGoogle Scholar
7Vos, K. and Krusemeyer, H.J., J. Phys. C 10, 3893 (1977).Google Scholar
8Streltsov, E.A., Pakhomov, V.P., Lazorenko-Manevich, R.M., and Kulak, A.I., Elektrokhimiya 19, 232 (1983).Google Scholar
9Razzini, G., Bicelli, L., Scrosati, B., Salvador, P., Pujadas, M., and Decker, F., J. Electrochem. Soc. 135, 1934 (1988).CrossRefGoogle Scholar
10Siripala, W. and Tomkiewicz, M., Phys. Rev. Lett. 50, 443 (183).CrossRefGoogle Scholar
11Lemasson, P. and Nguyen Van Huong, C., J. Electrochem. Soc. 135, 2080 (1988).CrossRefGoogle Scholar
12Cotting, T. and von Känel, H., Helv. Phys. Acta 58, 788 (1985).Google Scholar