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29Si nuclear magnetic resonance spectra of transition metal silicides

Published online by Cambridge University Press:  31 January 2011

T. M. Duncan
Affiliation:
A T & Bell Laboratories, Murray Hill, New Jersey 07974
D. M. Hamilton
Affiliation:
A T & Bell Laboratories, Murray Hill, New Jersey 07974
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Abstract

The 29Si chemical shielding parameters derived from 29Si nuclear magnetic resonance (NMR) spectra of 25 silicides of Group IVB, VB, VIB, VIIB, and VIII metals are presented. The isotropic shifts of these silicides span the range from −1650 to + 925 ppm, relative to TMS, and have shielding anisotropies −250 to + 335 ppm; these extremes are approximately ten times as large as those of organosilicon and silicon oxide compounds. For silicides of Ti, Zr, Nb, Ta, Cr, Mo, W, Rh, Ni, Pd, Pt, and Cu, the chemical shielding interaction is sufficiently larger than the extraneous spectral broadening to allow detection of multiple phases owing to different crystal structures and local differences in stoichiometry. The potential to detect multiple phases in silicides of Hf, V, Mn, Fe, Ru, and Co is less owing to smaller differences in isotropic shifts and/or broadening that overwhelms the chemical shielding information. However, it is possible that the broadening is not an inherent property of these silicides, but rather, suggests the presence of structural defects in these particular samples.

Type
Articles
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

1Murarka, S. P., Silicides for VLSI Applications (Academic, New York, 1983).Google Scholar
2Duncan, T. M., unpublished results (1987).Google Scholar
3Phillips, V. J., Early Radio Wave Detection (Peregrinus, New York, 1980).Google Scholar
4Bloembergen, N. and Rowland, J. A., Acta Metall. 1, 731 (1953).CrossRefGoogle Scholar
5Haeberlen, U., in Advances in Magnetic Resonance, Suppl. 1, edited by Waugh, J. S. (Academic, New York, 1976), Chap. III.Google Scholar
6Aronsson, B., Acta Chem. Scand. 9, 1107 (1955).CrossRefGoogle Scholar
7Nowotny, H., Schachner, H., Kieffer, R., and Benesovsky, F., Monatsh. Chem. 84, 1 (1953)CrossRefGoogle Scholar
8Slichter, C. P., Principles of Magnetic Resonance (Springer, New York, 1978), 2nd ed.CrossRefGoogle Scholar
9Marsmann, H., in NMR: Basic Principles and Progress, edited by Diehl, P., Fluck, E., and Kosfeld, R. (Springer-Verlag, New York, 1981), Vol. 17, pp. 65235.Google Scholar
10Duncan, T. M., manuscript in preparation.Google Scholar
11Wyckoff, R. W. G., Crystal Structures (Wiley-Interscience, New York, 1963), 2nd ed.Google Scholar
12Finnie, L. N., J. Less Common Metals 4, 24 (1962).CrossRefGoogle Scholar