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The yield estimation of semiconductor products based on truncated samples

Published online by Cambridge University Press:  06 March 2014

K. Gu ,
X.Z. Jia ,
H.L. You  and
T. Liang
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Abstract

Product yield reflects the potential product quality and reliability, which means that high yield corresponds to good quality and high reliability. Yet consumers usually couldn’t know the actual yield of the products they purchase. Generally, the products that consumers get from suppliers are all eligible. Since the quality characteristic of the eligible products is covered by the specifications, then the observations of quality characteristic follow truncated normal distribution. In the light of maximum likelihood estimation, this paper proposes an algorithm for calculating the parameters of full Gaussian distribution before truncation based on truncated data and estimating product yield. The confidence interval of the yield result is derived, and the effect of sample size on the precision of the calculation result is also analyzed. Finally, the effectiveness of this algorithm is verified by an actual instance.

Keywords

Truncated normal distributionproduct qualityproduct yieldmaximum likelihood estimatefisher information matrix
Type
Research Article
Information
International Journal of Metrology and Quality Engineering , Volume 4 , Issue 3 , 2013 , pp. 215 - 220
Copyright
© EDP Sciences 2014

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