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Observational Model for Precision Astrometry with the Space Interferometry Mission

Published online by Cambridge University Press:  12 April 2016

Slava G. Turyshev
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91109
Mark H. Milman
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91109

Abstract

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The basic astrometric observable of the Space Interferometry Mission (SIM) instrument is the pathlength delay. This measurement is made by a combination of internal metrology measurements that determine the distance the starlight travels through the two arms of the interferometer and a measurement of the white light stellar fringe to find the point of equal pathlength. Because this operation requires a non-negligible integration time, the interferometer baseline vector is not stationary over this time period, as its absolute length and orientation are time-varying. This paper addresses how the time-varying baseline can be “regularized” so that it may act as a single baseline vector for multiple stars, as required for the solution of the astrometric equations.

Type
Section 5. Observational Projects
Copyright
Copyright © US Naval Observatory 2000

References

Boden, A.F., 1997, SIM Astrometric Grid Simulation Development and Performance Assessment, JPL Interoffice Memorandum.Google Scholar
Loiseau, S., Malbet, F., 1996, “Global astrometry with OSI,” Astron. Astrophys. Sup., 116, 373380.CrossRefGoogle Scholar
Swartz, R., 2000, Metrology Breaks and the SIM Astrometric Grid, JPL Interoffice Memorandum.Google Scholar
Milman, M.H. and Turyshev, S.G., 2000, Observational Model for Precision Astrometry with the Space Interferometry Mission, in Proc. “Interferometry in Optical Astronomy,” Lena, P.J. and Quirrenbach, A., eds., SPIE 4006, paper #99, to be published.Google Scholar