Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-25T16:13:56.702Z Has data issue: false hasContentIssue false

High Resolution EUV & Soft X-Ray Spectrometers Using Variable Groove Spacings

Published online by Cambridge University Press:  12 April 2016

M. Lampton
Affiliation:
Space Sciences Laboratory, University of California Berkeley CA 94720, USA
M.C Hettrick
Affiliation:
Space Sciences Laboratory, University of California Berkeley CA 94720, USA
S. Bowyer
Affiliation:
Space Sciences Laboratory, University of California Berkeley CA 94720, USA

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Spectroscopic analysis is a powerful technique for the diagnosis of temperatures and compositions of astrophysical plasmas. The EUV (100–1000Å) and soft x-ray (10–100Å) bands contain hundreds of potentially useful diagnostic lines. Unfortunately, traditional types of grating spectrometer become inefficient or unwieldy when adapted to stellar spectroscopy onboard a spacecraft. At grazing incidence, the required length of a high-resolution plane-grating spectrometer can easily exceed the length of the telescope feeding it. For these reasons, we have systematically explored ways to introduce a reflection grating into the converging beam formed by a given objective optical system ahead of its first focus. A spectrometer of this type results in an optical train no longer than the telescope’s existing prime-focus beam.

Type
Session 3. Non-Solar Astrophysics
Copyright
Copyright © Naval Research Laboratory 1984. Publication courtesy of the Naval Research Laboratory, Washington, DC.

References

1 Hettrick, M.C. and S, Bowyer, Appl. Opt. 22#24, 3921, 1983.CrossRefGoogle Scholar
2 Hettrick, M.C. and Martin, C., Proc SPIE Symp. 28, San Diego, 1984.Google Scholar
3 Hettrick, M.C., EUVE Report 321/81, Univ. Calif. Berkeley, 1982.Google Scholar
4 S.Bowyer, , Malina, R., Lampton, M., Finley, D., Paresce, F., & Penegor, G., Proc. Soc. Photo-Optical Instrum. Eng. 279 p. 176, 1982.Google Scholar
5 Werner, W., Appl. Opt. 16#8, 2078, 1977.CrossRefGoogle Scholar
6 Neviere, M., Vincent, P., and Maystre, D., Appl. Opt. 17*6, 1978.CrossRefGoogle Scholar
7 Neviere, M., Maystre, D., and Hunter, W.R., J. Opt. Soc. Amer 68*8, 1106, 1978.CrossRefGoogle Scholar
8 Cash, W., App J. Opt. 22*24, 3971, 1983.CrossRefGoogle Scholar
9 Hettrick, M.C., Appl. Opt. 23#18, 3221, 1984.CrossRefGoogle Scholar
10 Hettrick, M. and Bowyer, S., Appl. Opt., 1 Nov. 1984.Google Scholar