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Mechanical requirement and influence on the design and manufacturing of beam position monitor of Taiwan photon source

  • H. P. Hsueh (a1), I. T. Huang (a1), C. C. Chang (a1), S. N. Hsu (a1), G. Y. Hsiung (a1) and J. R. Chen (a1) (a2)...

Abstract

The beam position monitors (BPMs) with submicron-level resolution act as the major eyes of storage ring in detecting the position of electron beams and are used for feedback system to guide the beam orbit to the desired track. Compared to major improvements on backend electronics, the physical devices generate and transmit signals had little improvement due to the lack of control on manufacturing processes including all mechanical tolerance requirements. The design started with ANSYS to simulate mechanical deformation. Due to the small size (submillimetre) and complicated assembly of feedthrough structure, it is difficult to achieve 1 % tolerance (submicron) in all aspects including machining and brazing. The smallest tolerance for machining is 5 µ and the overall tolerance will be 30 µm. The influence of the tolerance on mechanical will be shown on time-domain reflectometry measurement. The resulted heat-related issue will also be discussed and addressed since the problem happened at SLAC (private communication with Albert Sheng at Stanford Linear Accelerator Center) and DIAMOND (presented at the RF Button Heating Mini-Workshop at EPAC 2008). Manufacturing steps will be described. The consequence of mismatch on manufacturing will be discussed. All related measurement and simulation data are presented in this paper.

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Corresponding author

Email address for correspondence: hxh167@nsrrc.org.tw

References

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Private Communication with Albert Sheng at SLAC.
Presented at the RF Button Heating Mini-Workshop at EPAC 2008.
Singh, O. 2008 NSLS-II Accelerator System Advisory Committee Review, Diagnostic Design and R&D.

Mechanical requirement and influence on the design and manufacturing of beam position monitor of Taiwan photon source

  • H. P. Hsueh (a1), I. T. Huang (a1), C. C. Chang (a1), S. N. Hsu (a1), G. Y. Hsiung (a1) and J. R. Chen (a1) (a2)...

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