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High-Temperature D.T.A. and X-Ray Diffraction Studies of Reactions

Published online by Cambridge University Press:  01 January 2024

F. M. Wahl  and
R. E. Grim
F. M. Wahl
Affiliation:
University of Illinois, Urbana, Illinois, USA
R. E. Grim
Affiliation:
University of Illinois, Urbana, Illinois, USA
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Abstract

Several reactions which take place in clay minerals at elevated temperatures were investigated by D.T.A. and continuous high-temperature X-ray diffraction. The combination of these techniques was used to examine the energy changes and phase transformations that occur in kaolinite, halloysite, illite, and montmorillonite at temperatures up to 1450°C.

Diffraction data obtained from these minerals as they were heated are used to interpret the nature of the structural transitions, and new phase developments in two-layer type clay minerals are compared with similar developments in three-layer type clays.

Continuous diffraction is used to detect changes that take place in the firing history of a clay in which small amounts of chemical impurities or other mineralizing substances are present or have been added. Several chemical impurities were added to each of the clays to determine their ability to either enhance or retard structural transition and new mineral development upon firing. The effects which these additives have on predicted structural changes are illustrated and are interpreted in lieu of chemical and structural requirements.

Type
Symposium on High Temperature Transformations
Information
Clays and Clay Minerals (National Conference on Clays and Clay Minerals) , Volume 12 , February 1963 , pp. 69 - 81
Copyright
Copyright © The Clay Minerals Society 1963

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References

Bohor, V. F. (1959) Characterization of illite and its associated mixed layers: Unpublished Ph.D. thesis, University of Illinois, 132 pages.Google Scholar
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Grim, R. E. and Kulbicki, G. (1957) Etude aux rayons X des reactions des mineraux argileux a haute temperature: Bull. Franc. Ceram. Soc., pp. 21–27.Google Scholar
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Wahl, F. M. (1962) Effect of impurities on kaolinite transformations as examined by high-temperature X-ray diffraction: Advances in X-ray Analysis; 10th Conf., Plenum Press, New York, pp. 264–275.Google Scholar