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Diffraction effects calculated for structural models of K-saturated montmorillonite containing different types of defects

  • V. A. D. Rits (a1), A. Plançon (a2), B. A. Sakharov (a1), G. Besson (a2), S. I. Tsipursky (a1) and C. Tchoubar (a2)...

Abstract

The general approach to the problem of the real structure of smectites requires an analysis based on the relationship between structural characteristics and diffraction patterns. This paper, which considers only the models corresponding to dioctahedral smectites saturated by K-cations and collapsed, includes: 1. Successive consideration of all models which are crystallochemically possible. These models may differ in (i) the structure and chemical composition of layers and interlayer spaces; (ii) the azimuthal orientations, translations and the mode of alternation of the layers; (iii) independent parameters which describe quantitatively the models (e.g. abundance of each type of layer, probability parameters defining the succession of layers, …). 2. Calculation, in all accessible domains of reciprocal space, of the distribution of intensities and profile variations, obtained by changing only one parameter at a time, that defines one type of structural feature (e.g. cation distribution in individual layers, stacking of the layers, nature of stacking faults, …). 3. A systematical analysis of the calculated diffraction patterns to establish the diffraction criteria which will help to interpret the experimental data explicitly.

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Bailey, S.W. (1966) Status of clay mineral structures. Clays Clay Miner. 26, 321.
Besson, G. (1980) Structures des smectites dioctaédriques. Paramètres conditionnant lesfautes d'empilement des feuillets. Thesis, Univ. Orléans, France.
Besson, G., Glaeser, R. & Tchoubar, C. (1983) Le césium, révélateur de structure des smectites Clay Miner. 18, 1119,
Brindley, G.W. & Brown, G. (1980) Crystal Structures of Clay Minerals and their X-ray Identification. Mineralogical Society, London.
Drits, V.A. & Sakharov, B.A. (1976) X-ray Analysis of Mixed-Layer Minerals (in Russian). Ed. Nauka, Moscow.
Güven, N. & Pease, R.W. (1975) Selected area electron diffraction studies on beidellite. Clay Miner. 10, 427436.
Mamy, J. & Gaultier, J.P. (1976). Les phénomènes de diffraction des rayonnements X et clectroniques par les réseaux atomiques. Application à l'étude de l'rordre cristallin dans les minéraux argileux. II Evolution structurale de la montmorillonite associée au phénoméne de fixation irréversible du potassium. Ann. Agron. 27 (I), 116.
Mering, J. & Oberlin, A. (1967) Electron-optical study of smectites. Clays Clay Miner. 15, 325.
Plançon, A. (1976) Phénomène de diffraction produit par les systèmes stratifiés comportant simultanément des feuillets de natures différentes et des fautes d'empilernent. Application à l'etude qualitative et quantitative des défauts dans les kaolinites partiellernent désordonnées. Thesis, Univ. Orléans, France.
Plançon, A. (1981) Diffraction by layer structures containing different kinds of layers and stacking faults. J. Appl Cryst. 14, 300304.
Plançon, A. & Tchoubar, C. (1976) Etude des fautes d'empilement dans les kaolinites partiellement désordonnées. II: Modèles d'émpilement comportant des fautes par rotation. J. App. Cryst., 9, 279285.
Plançon, A. & Tchoubar, C. (1977a) Determination of structural defects in phyllosilicates by X-ray powder diffraction. I: Principle of calculation of the diffraction phenomenon. Clays Clay Miner. 25, 430435.
Plançon, A. & Tchoubar, C. (1977b) Determination of structural defects in phyllosilicates by X-ray powder diffraction. II: Nature and proportion of defects in natural kaolinite. Clays Clay Miner. 25, 436450.
Plançon, A., Besson, G., Gaultier, J.P., Mamy, J. & Tchoubar, C. (1979) Qualitative and quantitative study of structural reorganization in montmorillonite after potassium fixation. Proc. Vlth Int. Clay Conf. Oxford 1978, 4554.
Sakharov, B.A., Naumov, A.S. & Drits, V.A, (1982a) X-ray diffraction by mixed-layer structures with random distribution of stacking faults (in Russian). Dok. Akad. Nauk. 265, 339343.
Sakharov, B.A., Naumov, A.S. & Drits, V.A. (1982b) X-ray intensities scattered by layer structure with short range ordering parameters S⩾1 and G⩾1 (in Russian). Dok. Akad. Nauk. 265, 871874.
Tsipursky, S.I. (1982) Determination of structural and crystallochemical features of dioctahedral micas and smectites by means of oblique texture electron diffraction Thesis n° 040020, Moscow, USSR (in Russian.)
Tsipursky, S.I. & Drits, V.A. (1977) Efficiency of method of the direct measurement of intensity in structural determination by means of oblique texture electron diffraction (in Rusian). Isvestia Acad. Nauk. Physical Series 11, 22632271.
Tsipursky, S.I., Drits, V.A. & Tcheckin, S.S. (1978) Determination of structure ordering in nontronites by means of oblique texture electron diffraction, (in Russian). Isvestia Acad. Nauk. Geol. Series 10, 105113.

Diffraction effects calculated for structural models of K-saturated montmorillonite containing different types of defects

  • V. A. D. Rits (a1), A. Plançon (a2), B. A. Sakharov (a1), G. Besson (a2), S. I. Tsipursky (a1) and C. Tchoubar (a2)...

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