Skip to main content Accessibility help
×
Home
Hostname: page-component-55597f9d44-n4bck Total loading time: 0.358 Render date: 2022-08-19T06:24:29.655Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "useRatesEcommerce": false, "useNewApi": true } hasContentIssue true

Diffraction effects calculated for structural models of K-saturated montmorillonite containing different types of defects

Published online by Cambridge University Press:  09 July 2018

V. A. D. Rits
Affiliation:
Geological Institute of USSR Academy of Sciences, Pyzhewsky 7, Moscow 1999017, USSR
A. Plançon
Affiliation:
Laboratory of Crystallography (ERA no. 841), University of Orleans, 45046 Orleans Cedex, France
B. A. Sakharov
Affiliation:
Geological Institute of USSR Academy of Sciences, Pyzhewsky 7, Moscow 1999017, USSR
G. Besson
Affiliation:
Laboratory of Crystallography (ERA no. 841), University of Orleans, 45046 Orleans Cedex, France
S. I. Tsipursky
Affiliation:
Geological Institute of USSR Academy of Sciences, Pyzhewsky 7, Moscow 1999017, USSR
C. Tchoubar
Affiliation:
Laboratory of Crystallography (ERA no. 841), University of Orleans, 45046 Orleans Cedex, France

Abstract

The general approach to the problem of the real structure of smectites requires an analysis based on the relationship between structural characteristics and diffraction patterns. This paper, which considers only the models corresponding to dioctahedral smectites saturated by K-cations and collapsed, includes: 1. Successive consideration of all models which are crystallochemically possible. These models may differ in (i) the structure and chemical composition of layers and interlayer spaces; (ii) the azimuthal orientations, translations and the mode of alternation of the layers; (iii) independent parameters which describe quantitatively the models (e.g. abundance of each type of layer, probability parameters defining the succession of layers, …). 2. Calculation, in all accessible domains of reciprocal space, of the distribution of intensities and profile variations, obtained by changing only one parameter at a time, that defines one type of structural feature (e.g. cation distribution in individual layers, stacking of the layers, nature of stacking faults, …). 3. A systematical analysis of the calculated diffraction patterns to establish the diffraction criteria which will help to interpret the experimental data explicitly.

Type
Research Article
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1984

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bailey, S.W. (1966) Status of clay mineral structures. Clays Clay Miner. 26, 321.Google Scholar
Besson, G. (1980) Structures des smectites dioctaédriques. Paramètres conditionnant lesfautes d'empilement des feuillets. Thesis, Univ. Orléans, France.Google Scholar
Besson, G., Glaeser, R. & Tchoubar, C. (1983) Le césium, révélateur de structure des smectites Clay Miner. 18, 1119,CrossRefGoogle Scholar
Brindley, G.W. & Brown, G. (1980) Crystal Structures of Clay Minerals and their X-ray Identification. Mineralogical Society, London.CrossRefGoogle Scholar
Drits, V.A. & Sakharov, B.A. (1976) X-ray Analysis of Mixed-Layer Minerals (in Russian). Ed. Nauka, Moscow.Google Scholar
Güven, N. & Pease, R.W. (1975) Selected area electron diffraction studies on beidellite. Clay Miner. 10, 427436.Google Scholar
Mamy, J. & Gaultier, J.P. (1976). Les phénomènes de diffraction des rayonnements X et clectroniques par les réseaux atomiques. Application à l'étude de l'rordre cristallin dans les minéraux argileux. II Evolution structurale de la montmorillonite associée au phénoméne de fixation irréversible du potassium. Ann. Agron. 27 (I), 116.Google Scholar
Mering, J. & Oberlin, A. (1967) Electron-optical study of smectites. Clays Clay Miner. 15, 325.CrossRefGoogle Scholar
Plançon, A. (1976) Phénomène de diffraction produit par les systèmes stratifiés comportant simultanément des feuillets de natures différentes et des fautes d'empilernent. Application à l'etude qualitative et quantitative des défauts dans les kaolinites partiellernent désordonnées. Thesis, Univ. Orléans, France.Google Scholar
Plançon, A. (1981) Diffraction by layer structures containing different kinds of layers and stacking faults. J. Appl Cryst. 14, 300304.CrossRefGoogle Scholar
Plançon, A. & Tchoubar, C. (1976) Etude des fautes d'empilement dans les kaolinites partiellement désordonnées. II: Modèles d'émpilement comportant des fautes par rotation. J. App. Cryst., 9, 279285.CrossRefGoogle Scholar
Plançon, A. & Tchoubar, C. (1977a) Determination of structural defects in phyllosilicates by X-ray powder diffraction. I: Principle of calculation of the diffraction phenomenon. Clays Clay Miner. 25, 430435.CrossRefGoogle Scholar
Plançon, A. & Tchoubar, C. (1977b) Determination of structural defects in phyllosilicates by X-ray powder diffraction. II: Nature and proportion of defects in natural kaolinite. Clays Clay Miner. 25, 436450.CrossRefGoogle Scholar
Plançon, A., Besson, G., Gaultier, J.P., Mamy, J. & Tchoubar, C. (1979) Qualitative and quantitative study of structural reorganization in montmorillonite after potassium fixation. Proc. Vlth Int. Clay Conf. Oxford 1978, 4554.Google Scholar
Sakharov, B.A., Naumov, A.S. & Drits, V.A, (1982a) X-ray diffraction by mixed-layer structures with random distribution of stacking faults (in Russian). Dok. Akad. Nauk. 265, 339343.Google Scholar
Sakharov, B.A., Naumov, A.S. & Drits, V.A. (1982b) X-ray intensities scattered by layer structure with short range ordering parameters S⩾1 and G⩾1 (in Russian). Dok. Akad. Nauk. 265, 871874.Google Scholar
Tsipursky, S.I. (1982) Determination of structural and crystallochemical features of dioctahedral micas and smectites by means of oblique texture electron diffraction Thesis n° 040020, Moscow, USSR (in Russian.)Google Scholar
Tsipursky, S.I. & Drits, V.A. (1977) Efficiency of method of the direct measurement of intensity in structural determination by means of oblique texture electron diffraction (in Rusian). Isvestia Acad. Nauk. Physical Series 11, 22632271.Google Scholar
Tsipursky, S.I., Drits, V.A. & Tcheckin, S.S. (1978) Determination of structure ordering in nontronites by means of oblique texture electron diffraction, (in Russian). Isvestia Acad. Nauk. Geol. Series 10, 105113.Google Scholar
30
Cited by

Save article to Kindle

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Diffraction effects calculated for structural models of K-saturated montmorillonite containing different types of defects
Available formats
×

Save article to Dropbox

To save this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Dropbox account. Find out more about saving content to Dropbox.

Diffraction effects calculated for structural models of K-saturated montmorillonite containing different types of defects
Available formats
×

Save article to Google Drive

To save this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Google Drive account. Find out more about saving content to Google Drive.

Diffraction effects calculated for structural models of K-saturated montmorillonite containing different types of defects
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *