The Microemission X-ray Spectrograph is the result of the consolidation of the fine focus electron optics employed in the X-ray microscope, and the spectrograph goniometer used in fluorescent X-ray analysis.
The electron beam, 5 microns in diameter, directly bombards the sample under study. The beam is focused using a three element electrostatic lens system.
Provisions are made for continuous sample viewing with light optics. Sample manipulation, provides for complete coverage of a sample one-half inch in diameter.
The characteristic X-rays generated at the sample are allowed to pass through a beryllium window and fall on the analyzing crystal.
The curved crystal diffracts the characteristic X-ray wavelengths and refocuses them at the bilateral slit ahead of the detector. The goniometer may either be hand operated or motor driven through the various 2 θ angles. Electron beam currents are regulated by controlling filament power oscillator output. Signals are fed through a preamplifier into a rate me ter and recorder or into a high speed sealer which may be set to count for accurate preset periods of time. Samples may be investigated either by complete spectrum analysis of a single point on the sample or by determining concentration changes of a particular element by moving the sample across the electron beam.