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XRF Technique as a Method of Choice for On-Site Analysis of Soil Contaminants and Waste Material

Published online by Cambridge University Press:  06 March 2019

Starislaw Piorek*
Affiliation:
Princeton Gamma-Tech A Member of the Outokumpu Group 1200 State Road Princeton, New Jersey 08540
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Abstract

Recent years were marked by a rapid increase of interest in the ase of x-ray fluorescence for on-site chemical characterization of contaminated soils and waste materials.

The known advantages of the XRF technique, such as capability of simultaneous, multielement analysis, speed of measurement (10 to 100 seconds), little or no sample preparation, wide concentration range, “portability,“ and ease of integration into environmental monitoring station(s), make it specifically suited for this application.

Major difficulties still inhibiting wider use of the XRF for hazardous waste screening stem from the lack of suitable calibration samples and proper protocols, as well as from the low awareness of the industry about the technique.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1989

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