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XRD Quantitative Phase Analysis Using the NBS*QYANT82 System*

Published online by Cambridge University Press:  06 March 2019

Camden R. Hubbard
Affiliation:
Center for Materials Science, National Bureau of Standards, Washington, D.C. 20234 USA
Carl R. Robbies
Affiliation:
Center for Materials Science, National Bureau of Standards, Washington, D.C. 20234 USA
Robert L. Snyder
Affiliation:
New York State College of Ceramics, Alfred University, Alfred, New York 14802 USA
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X-ray powder diffraction (XRD) is widely used for qualitative analysis of the phases in multiphase mixtures. To extend the characterization to the level of quantitative analysis (QA) requires solution of many challenging problems such as elimination of preferred orientation (1,2,3); selection of an appropriate reference standard which closely matches the analyte phase in crystallite size, thermal history, stoichiometry etc. (4); effectively collecting the experimental intensities (5,6); and finally, performing the data reduction and analysis.

The desire to solve the last problem in a general way and to incorporate the “best” procedures developed in several laboratories into one package was one of the stimuli for developing the NBS*QUANT82 system of programs. This system is integrally coupled with the data collection system AUTO (6,7).

Type
III. Quantitative XRD Analysis
Copyright
Copyright © International Centre for Diffraction Data 1982

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Footnotes

*

Contribution of the National Bureau of Standards, not subject to copyright.

References

1. Smith, S. T., Snyder, R.|L. and Brownell, W.|E., 1979, Minimization of Preferred Orientation in Powders by Spray Drying, Adv. X-Ray Analy., 22:77.Google Scholar
2. Calvert, L. D., Sirianni, A.|F., 1980, A Technique for Controlling Preferred Orientation in Powder Diffraction Samples, J. Appl. Cryst. 13:462.Google Scholar
3. Calvert, L. D., Sirianni, A.|P., Gainsford, G.|J. and Hubbard, C.|R., 1983, An Interlaboratory Comparison of Methods for Reducing Preferred Orientation, Adv. X-Ray Analy., 26:100.Google Scholar
4. McCarthy, G.|J., Gehringer, R. C., Smith, D.|K., Injaian, V.|M., Pfoertsch, D.|E. and Kabel, R.|L., 1981, Internal Standards for Quantitative X-Ray Phase Analysis:Crystallinity and Solid Solution, Adv. X∼Ray Analy., 24:253.Google Scholar
5. Szabo, P., 1978, Optimization of the Measuring Time in Diffraction Intensity Measurements, Acta Cryst, A34:551.Google Scholar
6. Snyder, R.|I., Hubbard, C.|R. and Panagiotopoulos, N.|C., 1982, A Second Generation Automates Powder Diffractometer.Control System, Adv. X-Ray.Analy., 25:245.Google Scholar
7. Snyder, R.L., Hubbard, C.R. and Panagiotopoulos, N.C., 1981, AUTO:A Real Time Diffractometer Control System, NBS Internal Report 81-2229, National Bureau of Standards, Washington, D.C. 20234Google Scholar
8. Morris, M.C., McMurdie, H.F., Evans, E.H., Paretzkin, B., Parker, H.S., Panagiotopoulos, N.C. and Hubbard, C.R., NBS Monograp. 25-Section 18, National Bureau of Standards, Washington, D.C. 20234.Google Scholar
9. Hubbard, C.R., Evans, E.H., and Smith, D.K., 1976, The Reference Intensity Ratio, I/I, for Computer Simulated Powder Patterns, J. Appl. Crysct. 9:169.Google Scholar
10. Copeland, L.E. and Bragg, R.H., 1958, Quantitative X-Ray Diffraction Analysis, Anal. Chem., 30:196.Google Scholar
11. Hanson, R.J. and Haskel, K.H., Sandia Laboratories Tech Reports SAND77-0552 (1978) and SAND78-1290 (1979).Google Scholar