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X-Ray Texture Measurement Using a Position Sensitive Detector

  • L. Wcislak (a1), H.J. Bunge (a1), M. Haase (a2) and C. Nauer-Gerhardt (a2)

Abstract

For pole figure measurement the flat sample has to be tilted which leads to peak broadening and peak overlap in peak-reach diffraction spectra. Using a linear position sensitive detector /PSD/, complete diffraction spectra can be obtained in each sample orientation. Peak separation can then be done by Gaussian fitting. When measuring with a PSD, each diffraction peak corresponds to a particular diffraction vector. This has to be taken into consideration by a coordinate transformation. The PSD-method is the only practical method of texture measurement for materials with complex diffraction spectra.

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1. Bunge, H.J., Wenk, H.R. and Pannetier, J. Neutron Diffraction Texture Analysis using a 2θ-Position Sensitive Detector. Textures and Microstnictures 5, 153170 (1982)
2. Heizmaim, J.J. and Laruelle, C. Simultaneous Measurement, of Several X Ray Pole Figures, in: J. Appl. Cryst. 19, 467472 (1986)
3. Parrish, W. and Huang, T. C. Accuracy of the Profile Fitting Method for X-Ray Diffractometry, in: NBS Special Publication 567, (1980) 95111
4. Schulz, S. Principles of X-Ray Diffraction Technique. in: J. Appl. Phys. 11 (1948) 233
5. Wcislak, L. and Bunge, H.J. Simultaneous Measurement of Pole Figures by X-Ray Diffraction Using a 2θ-Position Sensitive Detector. Proc. 1COTOM-9 (1990), Textures and Microstructures, in print

X-Ray Texture Measurement Using a Position Sensitive Detector

  • L. Wcislak (a1), H.J. Bunge (a1), M. Haase (a2) and C. Nauer-Gerhardt (a2)

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