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X-Ray Probe with Collimation of the Secondary Beam

  • Kurt F. J. Heinrich (a1)

Abstract

An attachment to a commercial flat-crystal X-ray fluorescent goniometer permits analysis of small areas. The selection of the sample area is achieved by collimating the secondary beam. The geometry of the probe, its stage, and counting statistics applied to the probe are discussed. Experimental data are shown referring to determination of spot size, counting rates obtained, and both qualitative and quantitative applications.

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References

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1. Adler, I., Axelrod, J., and Branco, J. J. R., Advances in X-Ray Analysis, Vol. 2, University of Denver, Plenum Press, New York, 1960, pp. 167173.
2. Thatcher, J. W. and Campbell, W. J.. “Applications of a Fluorescent X-Ray gpectrograph Probe,” Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, Pittsburgh Pa., March 1959.
3. Heinrich, K. F. J. and McKinley, T. D., “X-Ray Spectrometry Applied to Small Areas Using a Commercial Instrument,” Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy. Pittsburgh, pa., March 1960.
4. Heinrich, K. F. J., Advances in X-Ray Analysis, Vol. 3, University of Denver, Plenum Press, New York, 1960, pp. 95107.

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