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X-Ray Fluorescence Analysis Using Synchrotron Radiation

  • J.V. Gilfrich (a1), E.F. Skelton (a1), D.J. Nagel (a1), A.W. Webb (a1), S.B. Qadri (a2) and J.P. Kirkland (a2)...

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Synchrotron radiation (SR) has several unique properties which cause it to be used for many purposes in science and technology. It is continuous spectrally, collimated spatially, short-pulsed yet continuously-operating temporally, as well as polarized( 1). Many applications of SR have already been demonstrated. These range from production of fine scale structures by lithography to numerous studies of materials. Determination of atomic structure by diffraction and other scattering experiments and by absorption spectroscopy (EXAFS), and emission spectroscopic studies of electronic structure have been given most attention(2). Only limited attention has been paid to determination of materials composition by x-ray fluorescence analysis (XRF) employing synchrotron radiation. Sparks et al.(3-5) have performed the most notable experiments, examining mica inclusions for the presence of primordial super heavy elements and irradiating two National Bureau of Standards Standard Reference Materials (SRM 1571, Orchard Leaves and SRM 1632, Coal) to measure the fluorescent x—ray intensity from the trace elements.

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1. Winick, H., Properties of Synchrotron Radiation, iri “Synchrotron Radiation Research,” Winick, Herman and Doniach, S., eds., Plenum Press, New York (1980),
2. Winick, Herman and Doniach, S., eds., “Synchrotron Radiation Research,” Plenum Press, New York (1980).
3. Sparks, C.J.,Jr., Raman, S., Yakel, H.L., Gentry, R.V. and Krause, M.O., Search with Synchrotron Radiation for Superheavy Elements in Giant-Halo Inclusions, Phys. Rev. Lett. 38:205 (1977).
4. Sparks, C.J.,Jr., Raman, S., Ricci, E., Gentry, R.V. and Krause, M.O., Evidence against Superheavy Elements in Giant-Halo Inclusions Re-examined with Synchrotron Radiation, Phys. Rev. Lett. 40:507 (1978).
5. Sparks, C.J.,Jr., X-Ray Fluorescence Microprobe for Chemical Analysis in “Synchrotron Radiation Research,” Winick, Herman and Doniach, S., eds., Plenum Publishing Co., New York (1980).
6. Gilfrich, J.V., Skelton, E.F., Qadri, S.B., Kirkland, J.P. and Nagel, D.J., Synchrotron Radiation X-Ray Fluorescence Analysis, submitted to Analytical Chemistry.
7. Hunter, W.R., Williams, R.T., Rife, J.C., Kirkland, J.P., and Kabler, M.N., A Grating/Crystal Monochromator for the Spectral Range 5 eV to 5 keV, Nucl. Instrum. Meth. 195:141 (1982).
8. Brown, D.B., Gilfrich, J.V. and Peekerar, M.C., Measurement and Calculation of Absolute Intensities of X-Ray Spectra, Jour. Appl. Phys. 46:4537 (1975).
9. Micronatter Co., Route I, Box 72B, Eastsourtd, WA 98245.
10. Skelton, E.F., Kirkland, J. and Qadri, S.B., Energy-Dispersive Measurements of Diffracted Synchrotron Radiation as a Function of Pressure:Applications to Phase Transitions in KCl and KI, J. Appl. Cryst. 15:82 (1982).
11. Jenkins, R., Nomenclature, Symbols, Units and Their Usage in Spectrochemical Analysis-IV:X-Ray Emission Spectroscopy, Pure and Appl. Chem. 52:2542 (1980).
12. European Science Foundation, “European Synchrotron Radiation Facility:Supplement I, ‘The Scientific Case,” Farge, Y. and Duke, P.J., eds., Strasbourg (1979), pp. 7882.
13. Birks, L.S. and Gilfrich, J.V., Evaluation of Commercial Energy Dispersion X-Ray Analyzers for Water Pollution, Appl. Spectrosc. 32:204 (1978).
14. Johanson, T.B., R. Akselsson and Johansson, S.A.E., Proton-Induced X-Ray Emission Spectroscopy in Elemental Trace Analysis, Lund Institute of Technology, LUNP7109, August 1971.
15. Cooper, J.A., Comparison of Particle and Photon Excited X-Ray Fluorescence Applied to Trace Element Measurements on Environmental Samples, Wucl. Instrum. Meth. 106:525 (1973).

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