Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-25T08:37:22.334Z Has data issue: false hasContentIssue false
  • English
  • Français

Use of X-Ray Curved Sensitive Position Detector for Simultaneous Measurement of Several Pole Figures

Published online by Cambridge University Press:  06 March 2019

J.J. Heizmann ,
C. Laruelle  and
A. Vadon
J.J. Heizmann
Affiliation:
Structural Metallurgy Laboratory Metz University, 57 045, France
C. Laruelle
Affiliation:
Structural Metallurgy Laboratory Metz University, 57 045, France
A. Vadon
Affiliation:
Structural Metallurgy Laboratory Metz University, 57 045, France
Get access

Extract

At the moment, the time required to obtain a pole figure is about three hours, and generally several pole figures are needed to make a texture analysis. Therefore the time and the cost of texture measurement are widely increased.

Now, new position sensitive X-Ray detectors are appearing, which allow to record at one and the same time the whole 2Θ spectrum, i.e. the beams diffracted by several (hik1l1) lattice planes. So with this kind of detector, it will be possible to get simultaneously several pole figures.

Type
VIII. Advances in XRD Instrumentation and Procedures
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 421 - 427
Copyright
Copyright © International Centre for Diffraction Data 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Ballon, J., Comparat, J., and Pouxe, J., Nuclear Instruments and Methods 217 p.213, 1983.Google Scholar
2. Arndt, U.W., J. Appl. Cryst. 19, p.145-163, 1986.Google Scholar
3. Couterne, J.C. and Cizeron, G., J. Appl. Cryst, 4, p.461, 1971.Google Scholar
4. Schulz, L.G., J. Appl. Phys. 2C, p. 1030, 194-9.Google Scholar
5. Heizjnann, J.J. and Laruelle, C., J. Appl. Cryst. (Accepted, 1986).Google Scholar