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Techniques of Low Energy X-Ray Spectroscopy (0.1 to 2 keV Region)

  • Burton L. Henke (a1) and Murray A. Tester (a1)

Abstract

Presented here is a report on the development of practical techniques for laboratory spectroscopy in the 5 to 150 A wavelength region as may be applied, for example, to light element and surface state analysis, high temperature plasma diagnostics and to the design and calibration of x-ray astronomy measurements.

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1. Henke, B. L. and Tester, M. A., “Techniques of Low Energy X-Ray Spectroscopy (0.1 to 2 keV Region).” An Air Force Office of Scientific Research Technical Report (in preparation).
2. Henke, B. L. and Ebisu, E. S., “Low Energy X-Ray and Electron Absorption within Solids (100-1500 eV Region).” Advances in X-Ray Analysis, Vol. 17, p. 150213, Plenum Press (1973).
3. Henke, B. L. and Ebisu, E. S., “Low Energy X-Ray and Electron Absorption within Solids (100-1500 eV Region).” U. S. Air Force Office of Scientific Research. Interim. Report No . 72–2174, 1973.
4. Henke, B. L. and Lent, R. E., “Some Eecent Work in Low Energy X-Ray and Electron. Analysis,” Advances in X-Ray Analysis, Vol. 12, p. 480495, Plenum Press (1969).
5. Hugenberger, C. E. and Steele, W. J., “A Universal Type Pressure Controller for Thin Window Flow Proportional Counters,” Electron Probe Analysis Society of America (New Orleans, 1973).
6. Charles, M. W. and Cooke, B. A., “Proportional Counter Resolution,” Nucl. Instrum. Methods 61, 3136 (1968).
7. Alkhazov, G. D., “Statistics of Electron Avalanches and Ultimate Resolution of Proportional Counters,” Nucl. Instrum. Methods 82, 155-165 (1970).
8. Musket, R. G., “Detection of Proton-Inducted Boron X-Rays with a Si (Li) Detector,” Nucl. Instrum. Methods 117, 385389 (1971).
9. Henke, B. L., Perera, R. C. and Ono, E. H., “Ultrasoft X-Ray Bragg and Specular Reflection: The Effects of Anomalous Dispersion,” U. S. Air Force Office of Scientific Research Interim. Report No. 72-2174, 1974.
10. Liefeld, R. J., Kansely, S., Kirby, T. B. and Mott, D., “X-Ray Spectrometric Properties of Potassium Acid Phthalate Crystals,” Advances in X-Ray Analysis, Vol. 13, p. 373381, Plenum Press (1970).

Techniques of Low Energy X-Ray Spectroscopy (0.1 to 2 keV Region)

  • Burton L. Henke (a1) and Murray A. Tester (a1)

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