Skip to main content Accessibility help
×
Home

Size/Strain Broadening Analysis of SRM 676 Candidate Materials

  • Walter Kalceff (a1), James P. Cline (a2) and Robert B. Von Dreele (a3)

Abstract

A project was undertaken to compare the Williamson-Hall and Fourier teclrniques for analyzing particle-size and micro-strain induced x-ray line profile broadening. The four alumina powders analyzed in the study were the candidates from which SRM 676, a quantitative analysis Standard Reference Material, was chosen. SRM 660 (LaB6) was used to determine the instrument profile function, IPF. However, difficulty was encountered in fitting an appropriate mathematical model to the IPF data; this prevented the application of Fourier analysis methods and restricted the number of profiles that could be analyzed with the Williamson-Hall method. The size/stain data compared favorably with other microstructural data collected on these specimens.

Copyright

References

Hide All
Balzar, D. and Ledbetter, H. (1993), J. Appl. Cryst, 26, 97103.
Cline, J.P. (1992a), NIST SRM 676 Certificate.
Cline, J.P. (1992b), Proc. of the International Conference on Accuracy in Powder Diff. II (NIST publication 846).
Cline, J.P., Schiller, S.B. and Jenkins, R. (1992), Adv. in X-Ray Analysis, 35, 341352.
Cline, J.P., Von Dreele, R.B. and Kalceff, W. (1994), to be submitted to J. Appl. Cryst.
Howard, S.A. and Snyder, R.L. (1983), Adv. X-Ray Anal., 23, 7381.
Howard, S.A., and Snyder, R.L. (1989), J. Appl. Cryst, 22, 238243.
Kalceff, W., Armstrong, N. and Cline, J.P. (1994),‘A Review Of Deconvolution Strategies In X-Ray Profile Analysis’, in preparation.
Klug, H.P. and Alexander, L.E. (1974), X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, New York: Wiley and Sons.
Langford, J.I., Louër, D., Sonneveld, E.J. and Visser, J.W. (1986), Powder Diffraction, Vol. 1, No. 3, 211221.
Louër, D., Auffrédic, J.P., Langford, J.I., Ciosmak, D. and Niepce, J.C. (1983), J. Appl. Cryst., 16, 183191.
Phillips, D.L. (1962), J. Assoc. Comp. Mach., 9, 8497.
Sonneveld, E.J. and Visser, J.W. (1975), J. Appl, Cryst., 8, 17.
Twomey, S. (1963), J. Assoc. Comp. Mach., 10, 97101.
Twomey, S. (1977), Introduction to the Mathematics of Inversion in Remote Sensing and Indirect Measurements, Amsterdam: Elsevier.
Warren, B.E. and Averbach, B.L. (1950), J. Appl. Phys., 21, 595.
Warren, B.E. (1969), X-ray Diffraction, Reading, MA: Addison-Wesley.
Williamson, G.K. and Hall, W.H. (1953), Adv. X-ray Anal., 23, 7381.
Wilson, A.J.C. (1963), Mathematical Theory of X-ray Powder Diffractometry, Eindhoven: Centrex.

Size/Strain Broadening Analysis of SRM 676 Candidate Materials

  • Walter Kalceff (a1), James P. Cline (a2) and Robert B. Von Dreele (a3)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed