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Size/Strain Broadening Analysis of SRM 676 Candidate Materials

Published online by Cambridge University Press:  06 March 2019

Walter Kalceff ,
James P. Cline  and
Robert B. Von Dreele
Walter Kalceff
Affiliation:
Department of Applied Physics, University of Technology, Sydney P.O. Box 123, Broadway, NSW 2007, Australia
James P. Cline
Affiliation:
Ceramics Division, National Institute of Standards and Technology Gaithersburg, MD 20899, USA
Robert B. Von Dreele
Affiliation:
LANSCE, MS-H805, Los Alamos National Laboratory Los Alamos, NM 87645, USA
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Abstract

A project was undertaken to compare the Williamson-Hall and Fourier teclrniques for analyzing particle-size and micro-strain induced x-ray line profile broadening. The four alumina powders analyzed in the study were the candidates from which SRM 676, a quantitative analysis Standard Reference Material, was chosen. SRM 660 (LaB6) was used to determine the instrument profile function, IPF. However, difficulty was encountered in fitting an appropriate mathematical model to the IPF data; this prevented the application of Fourier analysis methods and restricted the number of profiles that could be analyzed with the Williamson-Hall method. The size/stain data compared favorably with other microstructural data collected on these specimens.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 343 - 349
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

Balzar, D. and Ledbetter, H. (1993), J. Appl. Cryst, 26, 97–103.Google Scholar
Cline, J.P. (1992a), NIST SRM 676 Certificate. Google Scholar
Cline, J.P. (1992b), Proc. of the International Conference on Accuracy in Powder Diff. II (NIST publication 846).Google Scholar
Cline, J.P., Schiller, S.B. and Jenkins, R. (1992), Adv. in X-Ray Analysis, 35, 341–352.Google Scholar
Cline, J.P., Von Dreele, R.B. and Kalceff, W. (1994), to be submitted to J. Appl. Cryst.Google Scholar
Howard, S.A. and Snyder, R.L. (1983), Adv. X-Ray Anal., 23, 73–81.Google Scholar
Howard, S.A., and Snyder, R.L. (1989), J. Appl. Cryst, 22, 238–243.Google Scholar
Kalceff, W., Armstrong, N. and Cline, J.P. (1994),‘A Review Of Deconvolution Strategies In X-Ray Profile Analysis’, in preparation.Google Scholar
Klug, H.P. and Alexander, L.E. (1974), X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, New York: Wiley and Sons.Google Scholar
Langford, J.I., Louër, D., Sonneveld, E.J. and Visser, J.W. (1986), Powder Diffraction, Vol. 1, No. 3, 211–221.Google Scholar
Louër, D., Auffrédic, J.P., Langford, J.I., Ciosmak, D. and Niepce, J.C. (1983), J. Appl. Cryst., 16, 183–191.Google Scholar
Phillips, D.L. (1962), J. Assoc. Comp. Mach., 9, 84–97.Google Scholar
Sonneveld, E.J. and Visser, J.W. (1975), J. Appl, Cryst., 8, 1–7.Google Scholar
Twomey, S. (1963), J. Assoc. Comp. Mach., 10, 97–101.Google Scholar
Twomey, S. (1977), Introduction to the Mathematics of Inversion in Remote Sensing and Indirect Measurements, Amsterdam: Elsevier.Google Scholar
Warren, B.E. and Averbach, B.L. (1950), J. Appl. Phys., 21, 595.Google Scholar
Warren, B.E. (1969), X-ray Diffraction, Reading, MA: Addison-Wesley.Google Scholar
Williamson, G.K. and Hall, W.H. (1953), Adv. X-ray Anal., 23, 73–81.Google Scholar
Wilson, A.J.C. (1963), Mathematical Theory of X-ray Powder Diffractometry, Eindhoven: Centrex.Google Scholar