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REX: A Computer Program for Pixe Spectrum Resolution of Aerosols

Published online by Cambridge University Press:  06 March 2019

Henry C. Kaufmann ,
K. Roland Akselsson  and
William J. Courtney
Henry C. Kaufmann
Affiliation:
Department of Physics Florida State University, Tallahassee, FL 32306
K. Roland Akselsson*
Affiliation:
Department of Oceanography Florida State University, Tallahassee, FL 32306
William J. Courtney*
Affiliation:
Department of Physics Florida State University, Tallahassee, FL 32306
*
3Present address: Department of Physics University of Lund, Lund, Sweden
4Present address: Department of Physics Florida A & M University, Tallahassee, Florida
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Abstract

REX is a Fortran program for analysis of spectra obtained in PIXE analysis. The underlying model is still under development; however, one year of experience has demonstrated REX's capability to be a fast reliable tool. The modeling of the different components and effects of the physical model is briefly discussed. Evidence is shown that secondary effects mostly due to Compton-scattering in and around the detector are important factors. In order to assure that heavy elements are recorded with sufficient sensitivity during short bombardment times, low energy X-rays are suppressed but not completely absorbed by use of a Mylar absorber with a hole. Such an absorber sometimes introduces severe problems for other techniques of spectrum analysis. However, to REX there is only the job to find the transmission curve of the absorber.

Type
X-Ray Spectrometry in Environmental Analysis
Information
Advances in X-Ray Analysis , Volume 19: Twenty-Fourth Annual Conference on Applications of X-ray Analysis, August 6-8, 1975 , 1975 , pp. 355 - 366
Copyright
Copyright © International Centre for Diffraction Data 1975

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References

1. Johansson, T.B., Grieken, R.E. Van, Kelson, J.W., and Winchester, J.W., “Elemental Trace Analysis of Small Samples by Proton-Induced X—Ray Emission”, Anal. Chem. 47, 855–860 (1975).Google Scholar
2. Kaufmann, H.C., to be published.Google Scholar
3. Kaufmann, H.C. and Akselsson, R., “Non-Linear Least Squares Analysis of Proton-Induced X-Ray Emission Data”, Advances in X-Ray Analysis, Vol. 18, Pickles, W.L., Barrett, C.S., Newkirk, J.B., and Ruud, C.O., eds., pp, 353–361, Plenum Press, New York (1975).Google Scholar
4. Folkmann, F., Borggren, J. and Kjeldgaard, A., “Sensitivity in Trace Element Analysis by p, α and 16O Induced X-Rays”, Nucl. Instr. Meth. 119, 117–123 (1974).Google Scholar
5. Akselsson, R.. and Johansson, T.B., “X-Ray Production by 1.5-11 MeV Protons” Z. Physik 266, 245–255 (1974).Google Scholar
6. Bambynek, W., Crasemann, B., Fink, R.W., Freund, H.U., Mark, H., Swift, C.D., Price, R.E., and Rao, P. Venugopala, “X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition Probabilities”, Rev. Mod. Phys. 44, 716–813 (1972).Google Scholar
7. Gallagher, W.J. and Cipolla, S.J., “A Model-Based Efficiency Calibration of a Si(Li) Detector in the Energy Region from 3 to 140 keV”, Nucl. Instr. Meth. 122, 405–414 (1974).Google Scholar