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Results of a Round Robin Study of Systematic Errors Found in Routine X-ray Diffraction Raw Data

Published online by Cambridge University Press:  06 March 2019

Walter N. Schreiner
Affiliation:
Philips Laboratories A Division of North American Philips Corporation Briarcliff Manor, NY 10510
Tim Fawcett
Affiliation:
Philips Laboratories A Division of North American Philips Corporation Briarcliff Manor, NY 10510
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Extract

The JCFDS-ICDD based in Swarthmore, PA maintains and distributes a database of powder diffraction data. This database is widely used throughout the world by x-ray analytical laboratories for crystalline phase identification. It is the charter of that organization to update, expand and upgrade the quality of data in the database. As this work is carried out, the database is made available on an annual basis at a fee Commensurate with the committee's operation as a self-sustaining, non-profit organization.

Type
IX. XRD Search/Match Methods and Quantitative Analysis
Copyright
Copyright © International Centre for Diffraction Data 1984

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References

1. Jenkins, R., Hom, T., villamizar, C., Schreiner, W.N., Adv. in X-Ray Analysis, 25, 289 (1982).Google Scholar
2. Appleman, D.E, NTIS Job 9214, “Indexing a Least Squares Refinement of Powder Diffraction Data”, U.S. Geological Survey, Washington, D.C. (1973).Google Scholar
3. Brown, A., Adv. in X-Ray Analyses, 26, 11 (1983).Google Scholar