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Resolution Enhancement for Cu Kα Emission of Y-Ba-Cu-O Compounds

Published online by Cambridge University Press:  06 March 2019

N. Saitoh ,
Y. Higashi ,
M. Minarai ,
S. Fukushima ,
Y. Gohshi ,
S. Kohiki  and
T. Wada
N. Saitoh
Affiliation:
National Research Institute of Police Science, 6 Sanbanoho, Chlyoda-ku, Tokyo 102, Japan
Y. Higashi
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan
M. Minarai
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan
S. Fukushima
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan
Y. Gohshi
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan
S. Kohiki
Affiliation:
Matsushita Technoresearoh Inc., Moriguchi, Osaka 570, Japan
T. Wada
Affiliation:
Central Research Laboratories, Matsushita Electric Industries, Moriguchi, Osaka 570, Japan
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Extract

Since the discovery of the Y-Ba-Cu-O superconductors, their physical properties have been investigated by various methods. The chemical state of Cu in Y-Ba-Cu-O compounds la one of the greatest issues because the mechanism of superconductivity in Y-Ba-Cu-O is not understood theoretically. We are analyzing X-ray fluorescence spectra of Cu compounds including superconductors, intending to analyze the chemical state of Cu in Y-Ba-Cu-O. As for other 3d transition elements, structures due to unpaired electrons appear clearly on the lower energy side of the Kα1 line of the element. However there are little differences observed among Cu Kα spectra of Cu compounds even if they are measured by a high-resolution two-crystal spectrometer (see Fig. 1). Although Cu is a member of 3d transition elements, its Kα spectrum shows somewhat different behavior compared with other 3d transition elements. This point is one subject we are interested in.

Type
V. XRF Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 155 - 165
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

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