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Residual Stress and Microstructural Characterization Using Rietveld Refinement of a Carburized Layer in a 5120 Steel

Published online by Cambridge University Press:  06 March 2019

P. Rangaswamy ,
M.A.M. Bourke ,
A. C. Lawson ,
J.O' Rourke  and
J. A. Goldstone
P. Rangaswamy
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, 87545, USA
M.A.M. Bourke
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, 87545, USA
A. C. Lawson
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, 87545, USA
J.O' Rourke
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, 87545, USA
J. A. Goldstone
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, 87545, USA
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Extract

Rietveld refinement of X-ray diffraction patterns has been used to provide microstructural information complementary to conventional X-ray residual stress measurements through a carburized layer containing a maximum vol. 25 % of retained austenite. Layers in a simple specimen were removed incrementally by electropolishing and, at each depth in addition to conventional residual stress measurements in both the martensite and retained austenite, data were collected at ѱ = 0 for Rietveld refinement. The refinements provide accurate values for the lattice parameters in the respective phases that can be related to carbon content and micro-structure. Besides to providing qualitative information concerning the microstructure and possible surface decarburization, the c/a ratio of the martensite potentially offers an independent technique for determining carbon content profiles

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 319 - 329
Copyright
Copyright © International Centre for Diffraction Data 1995

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