The X-ray microscope is an electrostatic optical instrument employing X-rays for shadow projection to magnify and reveal detailed internal structure of specimens opaque to light or electrons. Its many advantages — high resolving power, greater penetration, large depth of field, and stereographic presentation — make the X-ray Microscope a versatile instrument for industrial research and development. Because the instrument was recently introduced, little information is available on specimen preparation techniques, or types of specimens suitable for study. A few of the many possible applications will be discussed, as well as a brief review of the technical details of the instrument.