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Problems in the Derivation of d-Values from Experimental Digital XRD Patterns

Published online by Cambridge University Press:  06 March 2019

Ron Jenkins
Affiliation:
JCPDS-ICDD Swarthmore, PA
Monte Nichols
Affiliation:
Sandia National Laboratories Livermore, CA
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Abstract

Most commercially available, automated powder diffractometers include software packages for the determination of d-values from experimentally recorded digitized patterns. While many of these patterns offer great flexibility to the user, indications from a recent Round-Robin Study [1] are that many users are confused as to the correct use of such parameters as choice of step size and counting time, the degree of data smoothing, peak-hunting parameters, setting of background level, and the consequences of background subtraction and α2 stripping. This paper will reviews these various factors and give some guidelines as to the establishment of optimum conditions.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

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