It is of interest today to use polarized X-rays in X-ray secondary fluorescence as a means of improving signal to noise ratios in the analysis of trace elements. Current experimental design makes use of two mutually perpendicular scatterings from plane parallel materials. Radiation with the electric field vector in the scattering plane (scattering angle = 90°) will be annihilated. Hence, after the mutually orthogonal, 90° scatterings no source X-rays should reach the detector. In practice source X-rays will only be greatly reduced at the detector due to such things as multiple scatter and collimator divergence. An experimental problem associated with this design however is the reduced intensity of the signal because of the scatterings with concomitant increase in analysis time.