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Optimal Calibration Curves for Guinier-Type Focusing Cameras

Published online by Cambridge University Press:  06 March 2019

Allan Brown*
Affiliation:
AB Atomenergi, Studsvik, Nyköping, Sweden
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Abstract

The inclusion of an internal calibrant in specimens prepared for Guinier-type focusing cameras is a well-established practice. The true reasons for performing calibration are, however, not always clearly understood. Accordingly, procedures adopted on the basis of this calibration for converting distances measured on the film into reliable values of θ vary in detail from one laboratory to another. The possibility that calibration curves can exhibit different degrees of reliability, depending upon camera alignment, is even less generally appreciated. The following account records efforts made over the years to come to terms with these problems in order to obtain unit cell dimensions at the 0.01 % level of precision from the routine measurement of Guinier diffraction patterns.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1977

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References

1. Hägg, G., “Measurement of X-ray powder diffraction films with automatic correction for shrinkage”, Rev. Sci. Instr. 18 371 (1947).Google Scholar
2. Möller, M., “On the calibration and accuracy of the Guinier camera for the determination of intarplanar spacings”, Atomenergi Report, AE-67 (1962).Google Scholar
3. Beu, K.E., Musil, F.J. and Whitney, D.R., “Precise and accurate lattice parameters by film powder methods. I. The likelihood ratio method”, Acta Cryst. 15 1292 (1962).Google Scholar
4. Beu, K.E. and. Whitney, D.R., “Further developments in the likelihood ratio method for the precise and accurate determination of lattice parameters”, USAEC Report GAT-T-1289/Rev. 1, Goodyear Atomic Corporation (1965).Google Scholar
5. Owen, E.A. and Williams, G.I., “A low-temperature X-ray camera” J . Sci. Instr. 31, 49 (1954).Google Scholar
6. Mauer, F.A. and Bolz, L.R. , “Measurement of thermal expansion of cermet components by high temperature X-ray diffraction”, MBS Report, WADC-TR-55-473, (1955).Google Scholar
7. Straumanis, M. and Levins, A., “Prazisionsaufnahmen nach dem Verfahren von Debye und Scherrer II”, Z. Physik 98 461 (1936).Google Scholar
8. Brown, A.. “Structure data for some arsenic- and germanium-rich compounds of molybdenum”, Nature 206, 502 (1965).Google Scholar
9. Lee, A.J. and Raynor, G.V., “The lattice spacings of binary tin-rich alloys”, Proc. Phys. Soc. 67B, 737 (1954).Google Scholar
10. Jan, J.P., Steinemann, S. and Dinichert, P., “The density and lattice parameters of ruby”, Phys. Chem. Solids 12, 349 (1959-60).Google Scholar
11. Rooksby, H.P. and Willis, B. T. M., “The low-temperature crystal structure of magnetite”, Acta Cryst. 6, 565 (1953).Google Scholar
12. Keith, H.D., “Lattice spacings in clear crystalline quartz and their variability”, Am, mineralogist 40, 530 (1955).Google Scholar
13. Brown, A. and Rundqvist, S., “Refinement of the crystal structure of black phosphorus”, Acta Cryst.19, 684 (1965).Google Scholar
14. Busing, W.R. quoted by Arndt, U.W. and Willis, B. T. M., Single crystal diffractometry p. 264, Cambridge Univ. Press, Cambridge, 1966.Google Scholar