Hostname: page-component-5c6d5d7d68-vt8vv Total loading time: 0.001 Render date: 2024-08-22T00:48:58.011Z Has data issue: false hasContentIssue false
  • English
  • Français

The On-Stream X-Ray Analysis of Slurries for Process Control

Published online by Cambridge University Press:  06 March 2019

Johann P. Engelbrecht ,
Johan P.R. de Villiers  and
Stefan W. de Bruyn
Johann P. Engelbrecht
Affiliation:
Mineralogy Division Mintek Private Bag X3015 2125 Randburg South Africa
Johan P.R. de Villiers
Affiliation:
Mineralogy Division Mintek Private Bag X3015 2125 Randburg South Africa
Stefan W. de Bruyn
Affiliation:
Mineralogy Division Mintek Private Bag X3015 2125 Randburg South Africa
Get access

Abstract

An integrated XRD-XRF system for the on-stream analysis of slurries was configured to the requirements of industry for process control. The slurry-handling system includes a multiplexer, header tank, de-aerator and a windowless sample presenter. The XRD part of the system is composed of a molybdenum anode X-ray tube, a pyrolytic graphite primarybeam monochromator, a vertical fixed-geometry goniometer, and a simultaneous detector system. The X-ray beam is transmitted through the slurry curtain so that the diffracted intensities are measured in the forward diffracted mode. The energy-dispersive XRF spectrometer measures the reflected fluorescence intensities. Examples and data from the onstream XRD analysis of fluorspar and apatite are presented. Mention is made of the application of an integrated XRD-XRF system in the heavy-minerals and base-metal industries.

Type
IX. XRD Applications: Detection Levitts, Superconductors, Organics, Minerals
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 661 - 672
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. de Villiers, J.P.R., Ormrod, G.T.W. and Cole, A.E., On-stream analysis, by X-ray diffraction, of apatite-containing slurries, Spec. Publ. geol. Soc. S. Afr. 7:435 (1983).Google Scholar
2. Cole, A.E. and Villiers, J.P.R. de, Calibration and continuous measurement of apatite-containing slurries at Phosphate Development Corp., using X-ray diffraction, in Applied Mineralogy, Proc. Int. Congress Appl. Miner, Metallurgical Society of AIME, 89–102 (1985).Google Scholar
3. de Villiers, J.P.R., On-line analysis, by X-ray diffraction, of fluorspar-containing slurries, Report Ho. 2134D, Mintek, Randburg (1981).Google Scholar
4. Clark, W., “The development of apparatus and techniques for the coupled X-ray diffractometric analysis of slurries”, Upublished MSc-thesis, in Afrikaans, Rand Afrikaans University, Johannesburg, South Africa (1985).Google Scholar
5. de Villiers, J.P.R., Clark, W. and van den Heever, P.C., Quantitative analysis of fluorspar-containing slurries: A comparison of X-ray diffraction geometries, in Abstracts of the 15th General Meeting of the International Mineralogical Association, Beijing (1990).Google Scholar
6. de Villiers, J.P.R., A preliminary on-line analysis by X-ray diffraction of pyrite-containing slurries, Report No. 2135D, Mintek, Randburg(1981).Google Scholar
7. Klug, H.P. and Alexander, L.E., “X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials,” John Wiley & Sons, New York (1974)Google Scholar
8. Jenkins, R., “An introduction to X-ray spectrometry,” Heyden & Son Ltd, London (1974)Google Scholar