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On the Method of Variable Take-Off Angle for Quantitative X-Ray Fluorescence Analysis (XRFA)

Published online by Cambridge University Press:  06 March 2019

H. Ebel  and
M. F. Ebel
H. Ebel
Affiliation:
Institut für Angewandte Physik Technische Hochsehule Wien, Vienna, Austria
M. F. Ebel
Affiliation:
Institut für Angewandte Physik Technische Hochsehule Wien, Vienna, Austria
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Abstract

Two years ago a paper on a new method of X-ray fluorescence analysis was presented. This method uses a variable take-off geometry and permits a quantitative analysis without calibration curves or the knowledge of the primary X-ray spectrum. As references either chemically analysed samples or pure elements are used. In case that only primary excitation exists, under the aspect, mentioned above, the method is to be regarded as “absolute”. For secondary excitation a simple parabolic approximation has been introduced, which requires a calibration. This paper gives an outline on the progress obtained during the last two years.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 15: Twentieth Annual Conference on Applications of X-ray Analysis, August 11-13, 1971 , 1971 , pp. 176 - 184
Copyright
Copyright © International Centre for Diffraction Data 1971

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References

1. Ebel, H., “Quantitative X-ray fluorescence analysis with variable take-off angle,” Advances in X-ray Analysis, Vol. 13, 63–79 (1970),Google Scholar
2. Criss, J. W. and Birks, L. S., “Calculation methods for fluorescent X-ray spectrometry,” Anal. Chem. 40, 1080–1086 (1968).Google Scholar
3. Shiraiwa, T. and Fujino, N., “Theoretical Calculation of fluorescent X-ray intensities in fluorescent X-ray spectrochemical analysis,” Jap.J.Appl.Phys. 5, 886–899 (1966).Google Scholar
4. Ebel, H., Derdau, J. and Pollai, G., “Die Sekundaranregung bei der quantitativen Röntgen fluoreszenz analyse mitvariablem Beobachtumgswinkel,” Spectrochim. Acta 26B, 237–259 (1971).Google Scholar
5. Pollai, G. and Ebel, H., “Die Tertiäranregung in der quantitativen Rontgenfluoreszenzanalyse,” Spectrochim, Acta B (in press).Google Scholar
6. Pollai, G., Mantler, M. and Ebel, H., “Der EinfluB der Streuung auf die Röntgenfluoreszenzintensitat,” Spectrochim. Acta B (in press).Google Scholar
7. Ebel, H., Landler, F. and Dirschmid, H., “Zur Anregung charakteristischer Röntgenstrahlung durch Photoelektronen,” Zeitschr. F. Naturforschg. 26a, 927–923 (1971).Google Scholar
8. Ebel, H. and Mayr, M., “Praktische Anwendung der Röntgen fluoreszenz analyse mit variabler Strahlengeometrie,” Spectrochim. Acta 26 B, 291–299 (1971).Google Scholar