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Observed and Calculated XRPD Intensities for Single Substance Specimens

Published online by Cambridge University Press:  06 March 2019

Walter N. Schreiner  and
Giora Kimmel
Walter N. Schreiner
Affiliation:
Philips Laboratories, North American Philips Corporation Briarcliff Manor, New York 10510
Giora Kimmel
Affiliation:
Negev Nuclear Research Center, Beer-Sheva, Israel
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Extract

One of the areas of X-ray powder diffraction receiving considerable attention in recent years is quantitative analysis. This analysis depends on an accurate measurement of integrated diffraction line intensities. In order to study the accuracy of these measurements we have calculated integrated intensities from single crystal data for single substance powders and compared them to experimental data obtained in our laboratory.

Type
VI. Quantitative Phase Analysis by XRD
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 351 - 356
Copyright
Copyright © International Centre for Diffraction Data 1986

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Footnotes

†

This paper was offered as a report of work in progress. A complete manuscript is in preparation for submission to Powder Diffraction.

References

1. James, R.W., “The Optical Principles of the Diffraction of X-Rays”, Cornell Univ. Press, p. 41 (1965).Google Scholar
2. Azaroff, L.V., Acta Cryst. 8, pp. 701–704 (1955).Google Scholar
3. Jenkins, R., Norelco Reporter 21, No. 1, pp. 9-14 (1974).Google Scholar
4. International Tables for X-Ray Crystallography, Vol. IV. Table 2.2b, p. 99 (1974),Google Scholar
5. James, R.W., Ibid, p. 109.Google Scholar
6. Cox, D.E., Moodenbaugh, A.R., Sleight, A.W., Chen, H.Y., Proc. Symp. Accuracy in Powder Diffraction, NBS. pec. Pub. No. 567, pp. 189-201 (1980).Google Scholar
7. James, R.W., Ibid, p. 24.Google Scholar
8. James, R.W., Ibid, Chap. 4.Google Scholar
9. International Tables, Ibid, Table 2.3.1, p. 149.Google Scholar
10. Warren, B.E., “X-Ray Diffraction”, Addison-Wesley, Reading, MA. p. 47 (1969).Google Scholar
11. International Tables, Ibid, p. 291.Google Scholar
12. Chipman, D.R., Paskin, A., J. Appl. Phys. 30, 1992-1997 and 1998-2001 (1959).Google Scholar
13. Wilchinsky, Z.W. Acta Crysta. 4, pp. 1–9 (1951).Google Scholar
14. Kimmel, G., Internal philips Report, No. 878, July 1985. 169-174 (1976).Google Scholar
15. The material employed was from the National Bureau of Standards, SRM-674 Intensity Standards for X-ray Diffraction,Google Scholar
16. Hubbard, C.R., E.H., Evans D. K., Smith, J. Appl. Cryst., pp. 169-174 (1976).Google Scholar